Roger Giles

Person

Huddersfield, GB

People

Patents Grantslast 30 patents

Information Patent Grant
Mass analysis apparatuses and methods
- Patent number 12,176,198
- Issue date Dec 24, 2024
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis apparatuses and methods
- Patent number 12,057,305
- Issue date Aug 6, 2024
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for analysing ions
- Patent number 11,581,173
- Issue date Feb 14, 2023
- Shimadzu Corporation
- Alina Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for performing field asymmetric waveform ion mobility spectr...
- Patent number 11,428,666
- Issue date Aug 30, 2022
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for performing field asymmetric waveform ion mobility spectr...
- Patent number 11,227,757
- Issue date Jan 18, 2022
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transport device for transporting charged particles
- Patent number 10,964,518
- Issue date Mar 30, 2021
- Shimadzu Corporation
- Matthew Gill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion transfer apparatus
- Patent number 10,770,279
- Issue date Sep 8, 2020
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap
- Patent number 10,600,631
- Issue date Mar 24, 2020
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer
- Patent number 10,269,549
- Issue date Apr 23, 2019
- Shimadzu Corporation
- Hamish Ian Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion manipulation device for guiding or confining ions in an ion pro...
- Patent number 9,892,899
- Issue date Feb 13, 2018
- Shimadzu Corporation
- Matthew Clive Gill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and a method of analysing ions in...
- Patent number 9,595,432
- Issue date Mar 14, 2017
- SHIMADZU CORPORATION
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
ToF mass analyser with improved resolving power
- Patent number 9,136,100
- Issue date Sep 15, 2015
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyser providing 3D electrostatic field region, mass spectro...
- Patent number 9,082,602
- Issue date Jul 14, 2015
- Shimadzu Corporation
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analysis apparatus and method
- Patent number 8,981,287
- Issue date Mar 17, 2015
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Co-axial time-of-flight mass spectrometer
- Patent number 8,952,325
- Issue date Feb 10, 2015
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,890,058
- Issue date Nov 18, 2014
- Shimadzu Corporation
- Sadao Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analysis apparatus and method of use
- Patent number 8,610,054
- Issue date Dec 17, 2013
- Shimadzu Corporation
- Roger Giles
- G01 - MEASURING TESTING
Information Patent Grant
Multi-inlet mass spectrometer
- Patent number 6,914,240
- Issue date Jul 5, 2005
- Thermo Finnigan LLC.
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source for mass analyzer
- Patent number 6,700,119
- Issue date Mar 2, 2004
- Thermo Finnigan LLC.
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR PERFORMING FIELD ASYMMETRIC WAVEFORM ION MOBILITY SPECTR...
- Publication number 20220381736
- Publication date Dec 1, 2022
- Shimadzu Corporation
- Roger GILES
- G01 - MEASURING TESTING
Information Patent Application
MASS ANALYSIS APPARATUSES AND METHODS
- Publication number 20220328298
- Publication date Oct 13, 2022
- SHIMADZU CORPORATION
- Roger GILES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSIS APPARATUSES AND METHODS
- Publication number 20220328299
- Publication date Oct 13, 2022
- SHIMADZU CORPORATION
- Roger GILES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR ANALYSING IONS
- Publication number 20210398788
- Publication date Dec 23, 2021
- SHIMADZU CORPORATION
- Alina GILES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR PERFORMING FIELD ASYMMETRIC WAVEFORM ION MOBILITY SPECTR...
- Publication number 20210063350
- Publication date Mar 4, 2021
- Shimadzu Corporation
- Roger GILES
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR PERFORMING FIELD ASYMMETRIC WAVEFORM ION MOBILITY SPECTR...
- Publication number 20210063351
- Publication date Mar 4, 2021
- Shimadzu Corporation
- Roger GILES
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR PERFORMING FIELD ASYMMETRIC WAVEFORM ION MOBILITY SPECTR...
- Publication number 20210066061
- Publication date Mar 4, 2021
- Shimadzu Corporation
- Roger GILES
- G01 - MEASURING TESTING
Information Patent Application
TRANSPORT DEVICE FOR TRANSPORTING CHARGED PARTICLES
- Publication number 20190252175
- Publication date Aug 15, 2019
- SHIMADZU CORPORATION
- Matthew GILL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20190180998
- Publication date Jun 13, 2019
- Shimadzu Corporation
- Hamish Ian STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP
- Publication number 20190103263
- Publication date Apr 4, 2019
- Shimadzu Corporation
- Roger GILES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRANSFER APPARATUS
- Publication number 20180350581
- Publication date Dec 6, 2018
- Shimadzu Corporation
- Roger GILES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRANSFER APPARATUS
- Publication number 20180350582
- Publication date Dec 6, 2018
- Shimadzu Corporation
- Roger GILES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MANIPULATION DEVICE FOR GUIDING OR CONFINING IONS IN AN ION PRO...
- Publication number 20170287689
- Publication date Oct 5, 2017
- Shimadzu Corporation
- Matthew Clive GILL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20170098533
- Publication date Apr 6, 2017
- Shimadzu Corporation
- Hamish Ian STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSER, MASS SPECTROMETER AND ASSOCIATED METHODS
- Publication number 20140291503
- Publication date Oct 2, 2014
- SHIMADZU CORPORATION
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR PROVIDING GASEOUS SAMPLE IONS/MOLECULES AND A CORRESP...
- Publication number 20140084154
- Publication date Mar 27, 2014
- Alexander Bazhenov
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ION ANALYSIS APPARATUS AND METHOD
- Publication number 20140070087
- Publication date Mar 13, 2014
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOF Mass Analyser With Improved Resolving Power
- Publication number 20130099111
- Publication date Apr 25, 2013
- Shimadzu Corporation
- Roger GILES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ANALYSIS APPARATUS AND METHOD OF USE
- Publication number 20120056085
- Publication date Mar 8, 2012
- SHIMADZU RESEARCH LABORATORY (EUROPE) LIMITED
- Roger Giles
- G01 - MEASURING TESTING
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER AND A METHOD OF ANALYSING IONS IN...
- Publication number 20100072362
- Publication date Mar 25, 2010
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CO-AXIAL TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20100072363
- Publication date Mar 25, 2010
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20080283742
- Publication date Nov 20, 2008
- Shimadzu Corporation
- Sadao Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-inlet mass spectrometer
- Publication number 20040011951
- Publication date Jan 22, 2004
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS

Roger Giles

Person

Patents Grantslast 30 patents

Mass analysis apparatuses and methods

Mass analysis apparatuses and methods

Apparatus for analysing ions

Device for performing field asymmetric waveform ion mobility spectr...

Device for performing field asymmetric waveform ion mobility spectr...

Transport device for transporting charged particles

Ion transfer apparatus

Ion trap

Time of flight mass spectrometer

Ion manipulation device for guiding or confining ions in an ion pro...

Time-of-flight mass spectrometer and a method of analysing ions in...

ToF mass analyser with improved resolving power

Mass analyser providing 3D electrostatic field region, mass spectro...

Ion analysis apparatus and method

Co-axial time-of-flight mass spectrometer

Mass spectrometer

Ion analysis apparatus and method of use

Multi-inlet mass spectrometer

Ion source for mass analyzer

Patents Applicationslast 30 patents

DEVICE FOR PERFORMING FIELD ASYMMETRIC WAVEFORM ION MOBILITY SPECTR...

MASS ANALYSIS APPARATUSES AND METHODS

MASS ANALYSIS APPARATUSES AND METHODS

APPARATUS FOR ANALYSING IONS

DEVICE FOR PERFORMING FIELD ASYMMETRIC WAVEFORM ION MOBILITY SPECTR...

DEVICE FOR PERFORMING FIELD ASYMMETRIC WAVEFORM ION MOBILITY SPECTR...

DEVICE FOR PERFORMING FIELD ASYMMETRIC WAVEFORM ION MOBILITY SPECTR...

TRANSPORT DEVICE FOR TRANSPORTING CHARGED PARTICLES

TIME OF FLIGHT MASS SPECTROMETER

ION TRAP

ION TRANSFER APPARATUS

ION TRANSFER APPARATUS

ION MANIPULATION DEVICE FOR GUIDING OR CONFINING IONS IN AN ION PRO...

TIME OF FLIGHT MASS SPECTROMETER

MASS ANALYSER, MASS SPECTROMETER AND ASSOCIATED METHODS

APPARATUS FOR PROVIDING GASEOUS SAMPLE IONS/MOLECULES AND A CORRESP...

ION ANALYSIS APPARATUS AND METHOD

TOF Mass Analyser With Improved Resolving Power

ION ANALYSIS APPARATUS AND METHOD OF USE

TIME-OF-FLIGHT MASS SPECTROMETER AND A METHOD OF ANALYSING IONS IN...

CO-AXIAL TIME-OF-FLIGHT MASS SPECTROMETER

Mass Spectrometer

Multi-inlet mass spectrometer