Roger I. Martin

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State College, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Quantum mechanical/X-ray crystallography diagnostic for proteins
- Patent number 11,688,488
- Issue date Jun 27, 2023
- Quantumbio, Inc.
- Lance Michael Westerhoff
- G01 - MEASURING TESTING
Information Patent Grant
Quantum mechanical/X-ray crystallography diagnostic for proteins
- Patent number 10,614,909
- Issue date Apr 7, 2020
- QuantumBio Inc.
- Lance Michael Westerhoff
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for thin film thickness mapping
- Patent number 6,909,772
- Issue date Jun 21, 2005
- Hypernex, Inc.
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for thin film thickness mapping
- Patent number 6,792,075
- Issue date Sep 14, 2004
- Hypernex, Inc.
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for quantitative phase analysis of textured po...
- Patent number 6,678,347
- Issue date Jan 13, 2004
- Hypernex, Inc.
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
QUANTUM MECHANICAL X-RAY CRYSTALLOGRAPHY AND CRYO-EM DIAGNOSTIC FOR...
- Publication number 20210407620
- Publication date Dec 30, 2021
- QuantumBio Inc.
- Lance Michael Westerhoff
- G01 - MEASURING TESTING
Information Patent Application
Quantum Mechanical/X-ray Crystallography Diagnostic for Proteins
- Publication number 20200194096
- Publication date Jun 18, 2020
- QuantumBio Inc.
- Lance Michael Westerhoff
- G01 - MEASURING TESTING
Information Patent Application
Quantum Mechanical/X-Ray Crystallography Diagnostic for Proteins
- Publication number 20190026421
- Publication date Jan 24, 2019
- QuantumBio Inc.
- Lance Michael Westerhoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Quantum Mechanical/X-Ray Crystallography Diagnostic for Proteins
- Publication number 20170228495
- Publication date Aug 10, 2017
- QuantumBio Inc.
- Lance Michael Westerhoff
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for thin film thickness mapping
- Publication number 20040170249
- Publication date Sep 2, 2004
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THIN FILM THICKNESS MAPPING
- Publication number 20040047447
- Publication date Mar 11, 2004
- Krzysztof J. Kozaczek
- G01 - MEASURING TESTING