Roger M. Young

Person

Warwick, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology management
- Patent number 9,652,729
- Issue date May 16, 2017
- International Business Machines Corporation
- William K. Hoffman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Alignment correction system and method of use
- Patent number 8,736,275
- Issue date May 27, 2014
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Grant
Alignment correction system and method of use
- Patent number 8,680,871
- Issue date Mar 25, 2014
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Grant
Alignment correction system and method of use
- Patent number 8,451,008
- Issue date May 28, 2013
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Grant
Monitoring stage alignment and related stage and calibration target
- Patent number 8,411,270
- Issue date Apr 2, 2013
- International Business Machines Corporation
- Shahin Zangooie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing work in process management system
- Patent number 7,937,177
- Issue date May 3, 2011
- International Business Machines Corporation
- Jeffrey P. Gifford
- G05 - CONTROLLING REGULATING
Information Patent Grant
Offset determination method for measurement system matching
- Patent number 7,853,345
- Issue date Dec 14, 2010
- International Business Machines Corporation
- Andrew C. Brendler
- G01 - MEASURING TESTING
Information Patent Grant
Determining angle of incidence with respect to workpiece
- Patent number 7,742,160
- Issue date Jun 22, 2010
- International Business Machines Corporation
- Clemente Bottini
- G01 - MEASURING TESTING
Information Patent Grant
Determining azimuth angle of incident beam to wafer
- Patent number 7,646,491
- Issue date Jan 12, 2010
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Grant
Alignment correction system and method of use
- Patent number 7,592,817
- Issue date Sep 22, 2009
- International Business Machines Corporation
- Robert J. Foster
- G01 - MEASURING TESTING
Information Patent Grant
Flipping stage arrangement for reduced wafer contamination cross se...
- Patent number 7,542,136
- Issue date Jun 2, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Grant
Optical spot geometric parameter determination using calibration ta...
- Patent number 7,477,365
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Offset determination for measurement system matching
- Patent number 7,318,206
- Issue date Jan 8, 2008
- International Business Machines Corporation
- Andrew C. Brendler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated tool recipe verification and correction
- Patent number 7,248,936
- Issue date Jul 24, 2007
- International Business Machines Corporation
- Timothy L. Holmes
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20130245993
- Publication date Sep 19, 2013
- International Business Machines Corporation
- Robert J. FOSTER
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20130238112
- Publication date Sep 12, 2013
- International Business Machines Corporation
- Robert J. FOSTER
- G01 - MEASURING TESTING
Information Patent Application
Metrology Management
- Publication number 20130110448
- Publication date May 2, 2013
- International Business Machines Corporation
- William K. Hoffman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20090312982
- Publication date Dec 17, 2009
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF RELEASING UNITS IN A PRODUCTION FACILITY
- Publication number 20090299511
- Publication date Dec 3, 2009
- International Business Machines Corporation
- John Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MONITORING STAGE ALIGNMENT AND RELATED STAGE AND CALIBRATION TARGET
- Publication number 20090185183
- Publication date Jul 23, 2009
- International Business Machines Corporation
- Shahin Zangooie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING SIGNAL QUALITY OF OPTICAL METROLOGY TOOL
- Publication number 20090182529
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ANGLE OF INCIDENCE WITH RESPECT TO WORKPIECE
- Publication number 20090180108
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Clemente Bottini
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SPOT GEOMETRIC PARAMETER DETERMINATION USING CALIBRATION TA...
- Publication number 20090027660
- Publication date Jan 29, 2009
- Shahin Zangooie
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment Correction System and Method of Use
- Publication number 20090021236
- Publication date Jan 22, 2009
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Application
FLIPPING STAGE ARRANGEMENT FOR REDUCED WAFER CONTAMINATION CROSS SE...
- Publication number 20090009763
- Publication date Jan 8, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING WORK IN PROCESS MANAGEMENT SYSTEM
- Publication number 20090005896
- Publication date Jan 1, 2009
- International Business Machines Corporation
- Jeffrey P. Gifford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING AZIMUTH ANGLE OF INCIDENT BEAM TO WAFER
- Publication number 20080316471
- Publication date Dec 25, 2008
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING TOOL SET MATCHING USING PRODUCTION DATA
- Publication number 20080201009
- Publication date Aug 21, 2008
- International Business Machines Corporation
- Andrew C. Brendler
- G05 - CONTROLLING REGULATING
Information Patent Application
Optical spot geometric parameter determination using calibration ta...
- Publication number 20080024781
- Publication date Jan 31, 2008
- International Business Machines Corporation
- Shahin Zangooie
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OFFSET DETERMINATION FOR MEASUREMENT SYSTEM MATCHING
- Publication number 20080015815
- Publication date Jan 17, 2008
- Andrew C. Brendler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED TOOL RECIPE VERIFICATION AND CORRECTION
- Publication number 20070179651
- Publication date Aug 2, 2007
- International Business Machines Corporation
- Timothy L. Holmes
- G05 - CONTROLLING REGULATING
Information Patent Application
OFFSET DETERMINATION FOR MEASUREMENT SYSTEM MATCHING
- Publication number 20070078612
- Publication date Apr 5, 2007
- International Business Machines Corporation
- Andrew C. Brendler
- G06 - COMPUTING CALCULATING COUNTING

Roger M. Young

Person

Patents Grantslast 30 patents

Metrology management

Alignment correction system and method of use

Alignment correction system and method of use

Alignment correction system and method of use

Monitoring stage alignment and related stage and calibration target

Manufacturing work in process management system

Offset determination method for measurement system matching

Determining angle of incidence with respect to workpiece

Determining azimuth angle of incident beam to wafer

Alignment correction system and method of use

Flipping stage arrangement for reduced wafer contamination cross se...

Optical spot geometric parameter determination using calibration ta...

Offset determination for measurement system matching

Automated tool recipe verification and correction

Patents Applicationslast 30 patents

ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE

ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE

Metrology Management

ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE

METHOD OF RELEASING UNITS IN A PRODUCTION FACILITY

MONITORING STAGE ALIGNMENT AND RELATED STAGE AND CALIBRATION TARGET

DETERMINING SIGNAL QUALITY OF OPTICAL METROLOGY TOOL

DETERMINING ANGLE OF INCIDENCE WITH RESPECT TO WORKPIECE

OPTICAL SPOT GEOMETRIC PARAMETER DETERMINATION USING CALIBRATION TA...

Alignment Correction System and Method of Use

FLIPPING STAGE ARRANGEMENT FOR REDUCED WAFER CONTAMINATION CROSS SE...

MANUFACTURING WORK IN PROCESS MANAGEMENT SYSTEM

DETERMINING AZIMUTH ANGLE OF INCIDENT BEAM TO WAFER

DETERMINING TOOL SET MATCHING USING PRODUCTION DATA

Optical spot geometric parameter determination using calibration ta...

OFFSET DETERMINATION FOR MEASUREMENT SYSTEM MATCHING

AUTOMATED TOOL RECIPE VERIFICATION AND CORRECTION

OFFSET DETERMINATION FOR MEASUREMENT SYSTEM MATCHING