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Roger McAleenan
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
High density waveguide assembly for millimeter and 5G applications
Patent number
11,506,686
Issue date
Nov 22, 2022
Advantest Corporation
Roger McAleenan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plating methods for modular and/or ganged waveguides for automatic...
Patent number
10,944,148
Issue date
Mar 9, 2021
Advantest Corporation
Don Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Frequency modulated (FM) chirp testing for automotive radars using...
Patent number
10,663,562
Issue date
May 26, 2020
Advantest Corporation
Roger McAleenan
G01 - MEASURING TESTING
Information
Patent Grant
Frequency modulated (FM) chirp testing for automotive radars using...
Patent number
10,401,476
Issue date
Sep 3, 2019
Advantest Corporation
Roger McAleenan
G01 - MEASURING TESTING
Information
Patent Grant
Wave interface assembly for automatic test equipment for semiconduc...
Patent number
10,393,772
Issue date
Aug 27, 2019
Advantest Corporation
Don Lee
G01 - MEASURING TESTING
Information
Patent Grant
Multiple waveguide structure with single flange for automatic test...
Patent number
10,381,707
Issue date
Aug 13, 2019
Advantest Corporation
Don Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Characterization of phase shifter circuitry in integrated circuits...
Patent number
10,371,741
Issue date
Aug 6, 2019
Advantest Corporation
Roger McAleenan
G01 - MEASURING TESTING
Information
Patent Grant
Integrated waveguide structure and socket structure for millimeter...
Patent number
10,114,067
Issue date
Oct 30, 2018
Advantest Corporation
Daniel Lam
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HIGH DENSITY WAVEGUIDE ASSEMBLY FOR MILLIMETER AND 5G APPLICATIONS
Publication number
20210156889
Publication date
May 27, 2021
Advantest Corporation
Roger McAleenan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FREQUENCY MODULATED (FM) CHIRP TESTING FOR AUTOMOTIVE RADARS USING...
Publication number
20190154798
Publication date
May 23, 2019
Advantest Corporation
Roger McAleenan
G01 - MEASURING TESTING
Information
Patent Application
CHARACTERIZATION OF PHASE SHIFTER CIRCUITRY IN INTEGRATED CIRCUITS...
Publication number
20180011171
Publication date
Jan 11, 2018
Advantest Corporation
Roger McAleenan
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE WAVEGUIDE STRUCTURE WITH SINGLE FLANGE FOR AUTOMATIC TEST...
Publication number
20170229753
Publication date
Aug 10, 2017
Advantest Corporation
Don LEE
G01 - MEASURING TESTING
Information
Patent Application
PLATING METHODS FOR MODULAR AND/OR GANGED WAVEGUIDES FOR AUTOMATIC...
Publication number
20170229757
Publication date
Aug 10, 2017
Advantest Corporation
Don LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAVE INTERFACE ASSEMBLY FOR AUTOMATIC TEST EQUIPMENT FOR SEMICONDUC...
Publication number
20170229754
Publication date
Aug 10, 2017
Advantest Corporation
Don LEE
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED WAVEGUIDE STRUCTURE AND SOCKET STRUCTURE FOR MILLIMETER...
Publication number
20170227598
Publication date
Aug 10, 2017
Advantest Corporation
Daniel LAM
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY MODULATED (FM) CHIRP TESTING FOR AUTOMOTIVE RADARS USING...
Publication number
20160291131
Publication date
Oct 6, 2016
Advantest Corporation
Roger McAleenan
G01 - MEASURING TESTING