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Roger Meier

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  • Almelo, NL
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Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray diffraction and fluorescence
    • Patent number 7,978,820
    • Issue date Jul 12, 2011
    • PANalytical B.V.
    • Alexander Kharchenko
    • G01 - MEASURING TESTING
  • Information Patent Grant

    X-ray instrument
    • Patent number 7,477,724
    • Issue date Jan 13, 2009
    • PANalytical B.V.
    • Roger Meier
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    X-RAY DIFFRACTION AND FLUORESCENCE
    • Publication number 20110096898
    • Publication date Apr 28, 2011
    • Alexander Kharchenko
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-ray instrument
    • Publication number 20060215818
    • Publication date Sep 28, 2006
    • Roger Meier
    • G01 - MEASURING TESTING