Roger Y. B. Young

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Camas, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer edge defect inspection using captured image analysis
- Patent number 7,968,859
- Issue date Jun 28, 2011
- LSI Corporation
- Roger Y. B. Young
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic edge bead removal
- Patent number 7,183,181
- Issue date Feb 27, 2007
- LSI Logic Corporation
- Xiao Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for inhibiting edge peeling of coating on semiconductor sub...
- Patent number 6,767,692
- Issue date Jul 27, 2004
- LSI Logic Corporation
- Roger Young
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for removing photoresist edge beads from thin film substr...
- Patent number 6,614,507
- Issue date Sep 2, 2003
- LSI Logic Corporation
- Roger Y. B. Young
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for removing photoresist edge beads from thin...
- Patent number 6,495,312
- Issue date Dec 17, 2002
- LSI Logic Corporation
- Roger Y. B. Young
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Dynamic edge bead removal
- Publication number 20060073703
- Publication date Apr 6, 2006
- Xiao Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer edge defect inspection
- Publication number 20050023491
- Publication date Feb 3, 2005
- Roger Y. B. Young
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for removing photoresist edge beads from thin film substr...
- Publication number 20030031959
- Publication date Feb 13, 2003
- Roger Y.B. Young
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY