Rohan Gosain

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Defect sampling for electron beam review based on defect attributes...
- Patent number 9,535,010
- Issue date Jan 3, 2017
- KLA-Tencor Corp.
- Rohan Gosain
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Defect Sampling for Electron Beam Review Based on Defect Attributes...
- Publication number 20150330912
- Publication date Nov 19, 2015
- KLA-Tencor Corporation
- Rohan Gosain
- G01 - MEASURING TESTING