TREA

Roland DIETERLE

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  • Holzgerlingen, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Probe card alignment
    • Patent number 10,955,440
    • Issue date Mar 23, 2021
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Adjustable load transmitter
    • Patent number 10,605,649
    • Issue date Mar 31, 2020
    • International Business Machines Corporation
    • Martin Eckert
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Grant

    Probe card alignment
    • Patent number 10,527,649
    • Issue date Jan 7, 2020
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card alignment
    • Patent number 10,422,817
    • Issue date Sep 24, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Adjustable load transmitter
    • Patent number 10,345,136
    • Issue date Jul 9, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Adjustable load transmitter
    • Patent number 10,146,144
    • Issue date Dec 4, 2018
    • International Business Machines Corporation
    • Martin Eckert
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Probe card alignment
    • Patent number 10,082,526
    • Issue date Sep 25, 2018
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Adjustable load transmitter
    • Patent number 10,082,419
    • Issue date Sep 25, 2018
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer probe alignment
    • Patent number 9,977,053
    • Issue date May 22, 2018
    • International Business Machines Corporation
    • Joerg G. Appinger
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Wafer probe alignment
    • Patent number 9,927,463
    • Issue date Mar 27, 2018
    • International Business Machines Corporation
    • Joerg G. Appinger
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE CARD ALIGNMENT
    • Publication number 20190391179
    • Publication date Dec 26, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    ADJUSTABLE LOAD TRANSMITTER
    • Publication number 20190204138
    • Publication date Jul 4, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD ALIGNMENT
    • Publication number 20190018044
    • Publication date Jan 17, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    ADJUSTABLE LOAD TRANSMITTER
    • Publication number 20190017861
    • Publication date Jan 17, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    PROBE CARD ALIGNMENT
    • Publication number 20190018043
    • Publication date Jan 17, 2019
    • International Business Machines Corporation
    • Martin Eckert
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROBE ALIGNMENT
    • Publication number 20170108547
    • Publication date Apr 20, 2017
    • International Business Machines Corporation
    • Joerg G. APPINGER
    • G01 - MEASURING TESTING
  • Information Patent Application

    WAFER PROBE ALIGNMENT
    • Publication number 20170108534
    • Publication date Apr 20, 2017
    • International Business Machines Corporation
    • Joerg G. APPINGER
    • G01 - MEASURING TESTING