Roland Hedrich

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Ehringshausen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for the optical inspection of wafers
- Patent number 8,451,440
- Issue date May 28, 2013
- KLA-Tencor MIE GmbH
- Kurt Hahn
- G01 - MEASURING TESTING
Information Patent Grant
Microscope
- Patent number 6,473,230
- Issue date Oct 29, 2002
- Leica Microsystems Wetzlar GmbH
- Roland Hedrich
- G02 - OPTICS
Information Patent Grant
Microscope stand for a wafer inspection microscope
- Patent number 6,236,503
- Issue date May 22, 2001
- Leica Microsystems Wetzlar GmbH
- Ulrich Kaczynski
- G02 - OPTICS
Information Patent Grant
Limit switching apparatus with defined overtravel for specimen prot...
- Patent number 5,315,080
- Issue date May 24, 1994
- Leica Mikroskopie und Systems GmbH
- Ulrich Kaczynski
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for the Optical Inspection of Wafers
- Publication number 20100295938
- Publication date Nov 25, 2010
- KLA-TENCOR MIE GMBH
- Kurt Hahn
- G01 - MEASURING TESTING
Information Patent Application
Microscope
- Publication number 20020135870
- Publication date Sep 26, 2002
- Leica Microsystems Wetzlar GmbH
- Roland Hedrich
- G02 - OPTICS