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Roland Ihrig
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Lampertheim, DE
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Patents Grants
last 30 patents
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Patent Grant
Automatic analyzer
Patent number
9,429,586
Issue date
Aug 30, 2016
Hitachi High-Technologies Corporation
Atsushi Watanabe
G01 - MEASURING TESTING
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Patent Grant
Automatic analyzer
Patent number
9,423,412
Issue date
Aug 23, 2016
Hitachi High-Technologies Corporation
Sayaka Sarwar
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
AUTOMATIC ANALYZER
Publication number
20130280130
Publication date
Oct 24, 2013
Roche Diagnostics Operations.Inc
Sayaka Sarwar
G01 - MEASURING TESTING
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Patent Application
AUTOMATIC ANALYZER
Publication number
20130280129
Publication date
Oct 24, 2013
Roche Diagnostics Operations.Inc
Atsushi Watanabe
G01 - MEASURING TESTING