Roland PUSCHE

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Kettenis, BE

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Patents Grantslast 30 patents

Information Patent Grant
Wafer surface curvature determining system
- Patent number 11,287,249
- Issue date Mar 29, 2022
- Soitec Belgium
- Roland Pusche
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A WAFER SURFACE CURVATURE DETERMINING SYSTEM
- Publication number 20200393241
- Publication date Dec 17, 2020
- EPIGAN NV
- Roland PUSCHE
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR FORMING SILICON CARBIDE ONTO A SILICON SUBSTRATE
- Publication number 20200332438
- Publication date Oct 22, 2020
- EpiGaN NV
- Roland PUSCHE
- H01 - BASIC ELECTRIC ELEMENTS