Roland R. Stoehr

Person

Nufringen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Contact probe arrangement
- Patent number 6,356,089
- Issue date Mar 12, 2002
- International Business Machines Corporation
- Thomas Bayer
- G01 - MEASURING TESTING
Information Patent Grant
Finger tester probe
- Patent number 6,344,751
- Issue date Feb 5, 2002
- atg test systems GmbH & Co. KG
- Manfred Prokopp
- G01 - MEASURING TESTING
Information Patent Grant
Contact probe arrangement for functional electrical testing
- Patent number 5,939,893
- Issue date Aug 17, 1999
- International Business Machines Corporation
- Gerhard Elsner
- G01 - MEASURING TESTING
Information Patent Grant
Adhesive bond for densely ordered elements
- Patent number 5,863,636
- Issue date Jan 26, 1999
- International Business Machines Corporation
- Frank Druschke
- G01 - MEASURING TESTING
Information Patent Grant
High speed coaxial contact and signal transmission element
- Patent number 5,532,657
- Issue date Jul 2, 1996
- International Business Machines Corporation
- Roland Stoehr
- G01 - MEASURING TESTING
Information Patent Grant
Buckling beam test probe assembly
- Patent number 5,488,314
- Issue date Jan 30, 1996
- International Business Machines Corporation
- Wolfram Brandt
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for plasma or reactive ion etching and method of etching...
- Patent number 5,304,278
- Issue date Apr 19, 1994
- International Business Machines Corporation
- Johann Bartha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of etching substrates having a low thermal conductivity
- Patent number 5,296,091
- Issue date Mar 22, 1994
- International Business Machines Corporation
- Johann Bartha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe assembly with fine positioning means
- Patent number 4,908,571
- Issue date Mar 13, 1990
- International Business Machines Corporation
- Roland R. Stoehr
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT PROBE ARRANGEMENT
- Publication number 20010011896
- Publication date Aug 9, 2001
- THOMAS BAYER
- G01 - MEASURING TESTING

Roland R. Stoehr

Person

Patents Grantslast 30 patents

Contact probe arrangement

Finger tester probe

Contact probe arrangement for functional electrical testing

Adhesive bond for densely ordered elements

High speed coaxial contact and signal transmission element

Buckling beam test probe assembly

Apparatus for plasma or reactive ion etching and method of etching...

Method of etching substrates having a low thermal conductivity

Contact probe assembly with fine positioning means

Patents Applicationslast 30 patents

CONTACT PROBE ARRANGEMENT