Roland Stohr

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Nufrigen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Modular multilayer interwiring structure
- Patent number 5,283,107
- Issue date Feb 1, 1994
- International Business Machines Corporation
- Thomas Bayer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact probe arrangement for electrically connecting a test system...
- Patent number 4,843,315
- Issue date Jun 27, 1989
- International Business Machines Corporation
- Thomas Bayer
- G01 - MEASURING TESTING
Information Patent Grant
Buckling beam test probe assembly
- Patent number 4,686,464
- Issue date Aug 11, 1987
- International Business Machines Corporation
- Michael Elsasser
- G01 - MEASURING TESTING