Rolf Hulb

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Hockenheim, DE

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Patents Grantslast 30 patents

Information Patent Grant
Self-trim and self-test of on-chip values
- Patent number 8,143,953
- Issue date Mar 27, 2012
- Dialog Semiconductor GmbH
- Hans Martin von Staudt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Self-trim and self-test of on-chip values
- Publication number 20100289590
- Publication date Nov 18, 2010
- Dialog Semiconductor GmbH
- Hans Martin von Staudt
- G01 - MEASURING TESTING