Romain Desplats

Person

Castanet Tolosan, FR

People

Patents Grantslast 30 patents

Information Patent Grant
Method of controlling a calculation device via a mobile element and...
- Patent number 10,388,148
- Issue date Aug 20, 2019
- CENTRE NATIONAL D'EDUTES SPATIALES
- Romain Desplats
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and installation for exposing the surface of an integrated c...
- Patent number 8,555,728
- Issue date Oct 15, 2013
- Centre National d'Etudes Spatiales
- Romain Desplats
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Wind-powered device for producing electrical energy
- Patent number 8,344,538
- Issue date Jan 1, 2013
- Centre National d'Etudes Spatiales (C.N.E.S.)
- Romain Desplats
- F05 - INDEXING SCHEMES RELATING TO ENGINES OR PUMPS IN VARIOUS SUBCLASSES OF...
Information Patent Grant
Method of analyzing an integrated circuit, method of observation an...
- Patent number 8,326,558
- Issue date Dec 4, 2012
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Device for analyzing an integrated circuit
- Patent number 7,692,151
- Issue date Apr 6, 2010
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Method and installation for analyzing an integrated circuit
- Patent number 7,560,940
- Issue date Jul 14, 2009
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,439,730
- Issue date Oct 21, 2008
- DCG Systems, Inc.
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic-field-measuring device
- Patent number 7,417,424
- Issue date Aug 26, 2008
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic-field-measuring probe
- Patent number 7,411,391
- Issue date Aug 12, 2008
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring a component of current based on magnetic fields
- Patent number 7,408,342
- Issue date Aug 5, 2008
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,400,154
- Issue date Jul 15, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,323,862
- Issue date Jan 29, 2008
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Method for customizing an integrated circuit element
- Patent number 7,190,822
- Issue date Mar 13, 2007
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 7,038,442
- Issue date May 2, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for automatic optimal location of an operation on...
- Patent number 6,970,759
- Issue date Nov 29, 2005
- Centre National d'Etudes Spatiales (C.N.E.S.)
- Romain Desplats
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatial and temporal selective laser assisted fault localization
- Patent number 6,967,491
- Issue date Nov 22, 2005
- Credence Systems Corporation
- Philippe Perdu
- G01 - MEASURING TESTING
Information Patent Grant
Method and installation for fast fault localization in an integrate...
- Patent number 6,948,107
- Issue date Sep 20, 2005
- Centre National d'Etudes Spatiales (C.N.E.S.)
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 6,943,572
- Issue date Sep 13, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting photon emissions from transistors
- Patent number 6,891,363
- Issue date May 10, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing input/output permutation of several conductive...
- Patent number 6,844,625
- Issue date Jan 18, 2005
- Centre National d'Etudes Spatiales (C.N.E.S.)
- Romain Desplats
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for comparing recorded pixel images representing equipotenti...
- Patent number 6,816,614
- Issue date Nov 9, 2004
- Centre National d'Etudes Spatiales
- Romain Desplats
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Installation and method for microscopic observation of a semiconduc...
- Patent number 6,552,341
- Issue date Apr 22, 2003
- Centre National d'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Grant
Method for locating faulty elements in an integrated circuit
- Patent number 6,526,546
- Issue date Feb 25, 2003
- Centre National d'Etudes Spatiales
- Guy Rolland
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF CONTROLLING A CALCULATION DEVICE VIA A MOBILE ELEMENT AND...
- Publication number 20180301023
- Publication date Oct 18, 2018
- Centre National D'Etudes Spatiales
- Romain DESPLATS
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Application
WIND-POWERED DEVICE FOR PRODUCING ELECTRICAL ENERGY
- Publication number 20120187695
- Publication date Jul 26, 2012
- CENTRE NATIONAL D'ETUDES SPATIALES (C.N.E.S.)
- Romain Desplats
- F05 - INDEXING SCHEMES RELATING TO ENGINES OR PUMPS IN VARIOUS SUBCLASSES OF...
Information Patent Application
METHOD OF ANALYZING AN INTEGRATED CIRCUIT, METHOD OF OBSERVATION AN...
- Publication number 20100241379
- Publication date Sep 23, 2010
- Centre National D'Etudes Spatiales
- Romain DESPLATS
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND INSTALLATION FOR EXPOSING THE SURFACE OF AN INTEGRATED C...
- Publication number 20100154558
- Publication date Jun 24, 2010
- Centre National D'Etudes Spatiales
- Romain Desplats
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Device for Analyzing an Integrated Circuit
- Publication number 20080218750
- Publication date Sep 11, 2008
- CENTRE NATIONAL D'ETUDES SPATIALED
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Method and Installation for Analyzing an Integrated Circuit
- Publication number 20080088324
- Publication date Apr 17, 2008
- CENTRE NATIONAL D'ETUDES SPATIALES
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Magnetic-field-measuring probe
- Publication number 20070132464
- Publication date Jun 14, 2007
- Centre National D'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Magnetic-field-measuring probe
- Publication number 20070108975
- Publication date May 17, 2007
- CENTRE NATIONALE D' ETUDES
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Magnetic-field-measuring device
- Publication number 20070052412
- Publication date Mar 8, 2007
- Centre National D'Etudes Spatiales
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS
- Publication number 20060181268
- Publication date Aug 17, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20060108997
- Publication date May 25, 2006
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20050231219
- Publication date Oct 20, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20050146321
- Publication date Jul 7, 2005
- Credence Systems Corporation
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Methods of using measured time resolved photon emission data and si...
- Publication number 20050024057
- Publication date Feb 3, 2005
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Spatial and temporal selective laser assisted fault localization
- Publication number 20050006602
- Publication date Jan 13, 2005
- Philippe Perdu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20040189335
- Publication date Sep 30, 2004
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting photon emissions from transistors
- Publication number 20040041575
- Publication date Mar 4, 2004
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Method for producing input/output permutation of several conductive...
- Publication number 20040022019
- Publication date Feb 5, 2004
- Romain Desplats
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for customizing an integrated circuit element
- Publication number 20030174171
- Publication date Sep 18, 2003
- Romain Desplats
- G01 - MEASURING TESTING
Information Patent Application
Method and device for automatic optimal location of an operation on...
- Publication number 20030079187
- Publication date Apr 24, 2003
- Romain Desplats
- G06 - COMPUTING CALCULATING COUNTING

Romain Desplats

Person

Patents Grantslast 30 patents

Method of controlling a calculation device via a mobile element and...

Method and installation for exposing the surface of an integrated c...

Wind-powered device for producing electrical energy

Method of analyzing an integrated circuit, method of observation an...

Device for analyzing an integrated circuit

Method and installation for analyzing an integrated circuit

Apparatus and method for detecting photon emissions from transistors

Magnetic-field-measuring device

Magnetic-field-measuring probe

Device for measuring a component of current based on magnetic fields

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Method for customizing an integrated circuit element

Apparatus and method for detecting photon emissions from transistors

Method and device for automatic optimal location of an operation on...

Spatial and temporal selective laser assisted fault localization

Method and installation for fast fault localization in an integrate...

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Method for producing input/output permutation of several conductive...

Method for comparing recorded pixel images representing equipotenti...

Installation and method for microscopic observation of a semiconduc...

Method for locating faulty elements in an integrated circuit

Patents Applicationslast 30 patents

METHOD OF CONTROLLING A CALCULATION DEVICE VIA A MOBILE ELEMENT AND...

WIND-POWERED DEVICE FOR PRODUCING ELECTRICAL ENERGY

METHOD OF ANALYZING AN INTEGRATED CIRCUIT, METHOD OF OBSERVATION AN...

METHOD AND INSTALLATION FOR EXPOSING THE SURFACE OF AN INTEGRATED C...

Device for Analyzing an Integrated Circuit

Method and Installation for Analyzing an Integrated Circuit

Magnetic-field-measuring probe

Magnetic-field-measuring probe

Magnetic-field-measuring device

APPARATUS AND METHOD FOR DETECTING PHOTON EMISSIONS FROM TRANSISTORS

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Methods of using measured time resolved photon emission data and si...

Spatial and temporal selective laser assisted fault localization

Apparatus and method for detecting photon emissions from transistors

Apparatus and method for detecting photon emissions from transistors

Method for producing input/output permutation of several conductive...

Method for customizing an integrated circuit element

Method and device for automatic optimal location of an operation on...