Roman Malendevich

Person

Oceanside, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer-level testing of optical and optoelectronic chips
- Patent number 7,586,608
- Issue date Sep 8, 2009
- Luxtera, Inc.
- Lawrence C. Gunn, III
- G02 - OPTICS
Information Patent Grant
Optoelectronic alignment structures for the wafer level testing of...
- Patent number 7,412,138
- Issue date Aug 12, 2008
- Luxtera, Inc.
- Roman Malendevich
- G02 - OPTICS
Information Patent Grant
Optical alignment loops for the wafer-level testing of optical and...
- Patent number 7,378,861
- Issue date May 27, 2008
- Luxtera, Inc.
- Roman Malendevich
- G02 - OPTICS
Information Patent Grant
Optoelectronic alignment structures for the wafer level testing of...
- Patent number 7,298,939
- Issue date Nov 20, 2007
- Luxtera, Inc.
- Roman Malendevich
- G02 - OPTICS
Information Patent Grant
Wafer-level testing of optical and optoelectronic chips
- Patent number 7,262,852
- Issue date Aug 28, 2007
- Luxtera, Inc.
- Lawrence C. Gunn, III
- G02 - OPTICS
Information Patent Grant
Optical alignment loops for the wafer-level testing of optical and...
- Patent number 7,224,174
- Issue date May 29, 2007
- Luxtera, Inc.
- Roman Malendevich
- G02 - OPTICS
Information Patent Grant
Optical probes with spacing sensors for the wafer level testing of...
- Patent number 7,183,759
- Issue date Feb 27, 2007
- Luxtera, Inc.
- Roman Malendevich
- G02 - OPTICS
Information Patent Grant
Wafer-level testing of optical and optoelectronic chips
- Patent number 7,184,626
- Issue date Feb 27, 2007
- Luxtera, Inc.
- Lawrence C. Gunn, III
- G02 - OPTICS
Information Patent Grant
Littrow gratings as alignment structures for the wafer level testin...
- Patent number 7,024,066
- Issue date Apr 4, 2006
- Luxtera, Inc.
- Roman Malendevich
- G02 - OPTICS

Roman Malendevich

Person

Patents Grantslast 30 patents

Wafer-level testing of optical and optoelectronic chips

Optoelectronic alignment structures for the wafer level testing of...

Optical alignment loops for the wafer-level testing of optical and...

Optoelectronic alignment structures for the wafer level testing of...

Wafer-level testing of optical and optoelectronic chips

Optical alignment loops for the wafer-level testing of optical and...

Optical probes with spacing sensors for the wafer level testing of...

Wafer-level testing of optical and optoelectronic chips

Littrow gratings as alignment structures for the wafer level testin...