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Romano Hoofman
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Leuven, BE
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Patents Grants
last 30 patents
Information
Patent Grant
Temperature monitoring
Patent number
10,101,214
Issue date
Oct 16, 2018
NXP B.V.
Friso Jedema
G01 - MEASURING TESTING
Information
Patent Grant
Food package with integrated RFID-tag and sensor
Patent number
9,884,715
Issue date
Feb 6, 2018
NXP B.V.
Romano Hoofman
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Wireless interconnect for an integrated circuit
Patent number
9,577,322
Issue date
Feb 21, 2017
NXP B.V.
Romano Hoofman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor and a method of assembling a sensor
Patent number
9,375,711
Issue date
Jun 28, 2016
NXP B.V.
Romano Hoofman
G01 - MEASURING TESTING
Information
Patent Grant
Integrated battery and IC
Patent number
9,034,493
Issue date
May 19, 2015
NXP B.V.
Romano Hoofman
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Stacked multi-cell battery concept
Patent number
8,906,534
Issue date
Dec 9, 2014
Taiwan Semiconductor Manufacturing Company, Ltd.
Romano Hoofman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensing environmental parameter through stress induced in IC
Patent number
8,872,290
Issue date
Oct 28, 2014
NXP B.V.
Romano Hoofman
G01 - MEASURING TESTING
Information
Patent Grant
pH sensor and manufacturing method
Patent number
8,742,470
Issue date
Jun 3, 2014
NXP, B.V.
Matthias Merz
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit manufacturing method and integrated circuit
Patent number
8,722,527
Issue date
May 13, 2014
NXP B.V.
Didem Ernur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Humidity sensor based on progressive corrosion of exposed material
Patent number
8,683,861
Issue date
Apr 1, 2014
NXP, B.V.
Aurelie Humbert
G01 - MEASURING TESTING
Information
Patent Grant
Method for fabrication of in-laid metal interconnects
Patent number
8,367,552
Issue date
Feb 5, 2013
NXP B.V.
Roel Daamen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Intrusion protection using stress changes
Patent number
8,330,191
Issue date
Dec 11, 2012
NXP B.V.
Romano Hoofman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Moisture sensor
Patent number
8,079,248
Issue date
Dec 20, 2011
NXP B.V.
Romano Hoofman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEMPERATURE MONITORING
Publication number
20150362376
Publication date
Dec 17, 2015
NXP B.V.
Friso Jedema
G01 - MEASURING TESTING
Information
Patent Application
PH SENSOR AND MANUFACTURING METHOD
Publication number
20140262781
Publication date
Sep 18, 2014
NXP B.V.
Matthias MERZ
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF SENSING A MOLECULE, AN APPARATUS AND A SEMICONDUCTOR CHIP...
Publication number
20130102085
Publication date
Apr 25, 2013
NXP B.V.
Hilco Suy
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
PH SENSOR AND MANUFACTURING METHOD
Publication number
20130069120
Publication date
Mar 21, 2013
NXP B.V.
Matthias MERZ
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT MANUFACTURING METHOD AND INTEGRATED CIRCUIT
Publication number
20120126408
Publication date
May 24, 2012
NXP B.V.
Didem Ernur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SENSOR CALIBRATION IN AN RFID TAG
Publication number
20110301903
Publication date
Dec 8, 2011
NXP B.V.
Arelie Humbert
G01 - MEASURING TESTING
Information
Patent Application
FOOD PACKAGE WITH INTEGRATED RFID-TAG AND SENSOR
Publication number
20110291806
Publication date
Dec 1, 2011
NXP B.V.
Romano Hoofman
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED BATTERY AND IC
Publication number
20110293969
Publication date
Dec 1, 2011
NXP B.V.
Romano HOOFMAN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR AND A METHOD OF ASSEMBLING A SENSOR
Publication number
20110217206
Publication date
Sep 8, 2011
NXP B.V.
Romano HOOFMAN
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
WIRELESS INTERCONNECT FOR AN INTEGRATED CIRCUIT
Publication number
20110199275
Publication date
Aug 18, 2011
NXP B.V.
Romano Hoofman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SENSING ENVIRONMENTAL PARAMETER THROUGH STRESS INDUCED IN IC
Publication number
20110127627
Publication date
Jun 2, 2011
NXP B.V.
Romano Hoofman
G01 - MEASURING TESTING
Information
Patent Application
Method for fabrication of in-laid metal interconnects
Publication number
20110097896
Publication date
Apr 28, 2011
Koninklijke Philips Electronics N.V.
Roel Daamen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTRUSION PROTECTION USING STRESS CHANGES
Publication number
20110089506
Publication date
Apr 21, 2011
NXP B.V.
Romano Hoofman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HUMIDITY SENSOR BASED ON PROGRESSIVE CORROSION OF EXPOSED MATERIAL
Publication number
20100192688
Publication date
Aug 5, 2010
NXP B.V.
Aurelie Humbert
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THEREOF
Publication number
20100001409
Publication date
Jan 7, 2010
NXP, B.V.
Aurelie Humbert
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STACKED MULTI-CELL BATTERY CONCEPT
Publication number
20090297938
Publication date
Dec 3, 2009
Taiwan Semiconductor Manufacturing Company, Ltd.
Romano HOOFMAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICRO DEVICE WITH MICROTUBES
Publication number
20090120669
Publication date
May 14, 2009
Koninklijke Philips Electronics N.V.
Romano Hoofman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Moisture Sensor
Publication number
20080316673
Publication date
Dec 25, 2008
NXP B.V.
Romano Hoofman
G01 - MEASURING TESTING