Ron Bar-Or

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Ramat-Gan, IL

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Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional surface metrology of wafers
- Patent number 11,662,324
- Issue date May 30, 2023
- Applied Materials Israel Ltd.
- Ido Almog
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for supporting a wafer
- Patent number 10,446,434
- Issue date Oct 15, 2019
- Applied Materials Israel Ltd.
- Doron Korngut
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Evaluation system and a method for evaluating a substrate
- Patent number 9,835,563
- Issue date Dec 5, 2017
- Applied Materials Israel Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHUCK FOR SUPPORTING A WAFER
- Publication number 20170309511
- Publication date Oct 26, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Doron Korngut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION SYSTEM AND A METHOD FOR EVALUATING A SUBSTRATE
- Publication number 20160077016
- Publication date Mar 17, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yoram Uziel
- G01 - MEASURING TESTING