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Ron Folman

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  • Rehovot, IL
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Patents Grantslast 30 patents

  • Information Patent Grant

    Coherent field gradient momentum splitting
    • Patent number 9,443,630
    • Issue date Sep 13, 2016
    • Ben-Gurion University of the Negev Research and Development Authority
    • Ron Folman
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Guided matter-wave Sagnac interferometer
    • Patent number 8,717,678
    • Issue date May 6, 2014
    • Ben Gurion University of the Negev, Research and Development Authority
    • Yonathan Japha
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Guided matter-wave Sagnac interferometer
    • Patent number 8,351,121
    • Issue date Jan 8, 2013
    • Ben-Gurion University of the Negev Research and Development Authority
    • Yonathan Japha
    • G01 - MEASURING TESTING
  • Information Patent Grant

    AtomChip device
    • Patent number 8,309,909
    • Issue date Nov 13, 2012
    • B.G. Negev Technologies and Applications
    • Valery Dikovsky
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Atom chip device
    • Patent number 8,247,760
    • Issue date Aug 21, 2012
    • Ben-Gurion University of the Negev
    • Tal David
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    High-quality-factor tunable microdisk
    • Patent number 7,466,889
    • Issue date Dec 16, 2008
    • Ben Gurion University of the Neger Research and Development Authority
    • Michael Rosenblit
    • G02 - OPTICS

Patents Applicationslast 30 patents

  • Information Patent Application

    COHERENT FIELD GRADIENT MOMENTUM SPLITTING
    • Publication number 20150200028
    • Publication date Jul 16, 2015
    • BEN GURION UNIVERSITY OF THE NEGEV RESEARCH AND DEVELOPMENT AUTHORITY
    • Ron Folman
    • G01 - MEASURING TESTING
  • Information Patent Application

    GUIDED MATTER-WAVE SAGNAC INTERFEROMETER
    • Publication number 20130188193
    • Publication date Jul 25, 2013
    • Ben Gurion University of the Negev, Research and Development Authority
    • Yonathan JAPHA
    • G01 - MEASURING TESTING
  • Information Patent Application

    GUIDED MATTER-WAVE SAGNAC INTERFEROMETER
    • Publication number 20110038053
    • Publication date Feb 17, 2011
    • Yonathan Japha
    • G01 - MEASURING TESTING
  • Information Patent Application

    ATOM CHIP DEVICE
    • Publication number 20100320995
    • Publication date Dec 23, 2010
    • Tal David
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    ATOMCHIP DEVICE
    • Publication number 20100154570
    • Publication date Jun 24, 2010
    • Ben Gurin University Of The Negev Research And Dev elopment Authority
    • Valery Dikovsky
    • G04 - HOROLOGY
  • Information Patent Application

    NOVEL MATERIAL AND PROCESS FOR INTEGRATED ION CHIP
    • Publication number 20090321719
    • Publication date Dec 31, 2009
    • BEN GURION UNIVERSITY OF THE NEGEV RESEARCH AND DEVELOPMENT AUTHORITY
    • Ron FOLMAN
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    High-Quality-Factor Tunable Microdisk
    • Publication number 20080292242
    • Publication date Nov 27, 2008
    • Ben Gurion Univeristy of the Negev Research and Development Authority
    • Michael Rosenblit
    • G02 - OPTICS