Ron Naftali

Person

Shoham, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Die-to-multi-die wafer inspection
- Patent number 11,803,961
- Issue date Oct 31, 2023
- Applied Materials Israel Ltd.
- Ron Naftali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for evaluating objects
- Patent number 11,177,048
- Issue date Nov 16, 2021
- Applied Materials Israel Ltd.
- Igor Krivts (Krayvitz)
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluating a region of an object
- Patent number 10,811,219
- Issue date Oct 20, 2020
- Applied Materials Israel Ltd.
- Ofer Shneyour
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chuck for supporting a wafer
- Patent number 10,446,434
- Issue date Oct 15, 2019
- Applied Materials Israel Ltd.
- Doron Korngut
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Controlling an intensity profile of an energy beam in additive manu...
- Patent number 10,421,125
- Issue date Sep 24, 2019
- Applied Materials, Inc.
- Hou T. Ng
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Controlling an intensity profile of an energy beam with a deformabl...
- Patent number 10,307,822
- Issue date Jun 4, 2019
- Applied Materials, Inc.
- Hou T. Ng
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Scanning an object using multiple mechanical stages
- Patent number 10,068,748
- Issue date Sep 4, 2018
- Applied Materials Israel Ltd.
- Yoram Uziel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Near-field sensor height control
- Patent number 10,060,736
- Issue date Aug 28, 2018
- Appled Materials Israel Ltd.
- Amir Moshe Sagiv
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for inspecting a sample by using a plu...
- Patent number 10,054,551
- Issue date Aug 21, 2018
- Applied Materials Israel Ltd.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Grant
System and method for forming a sealed chamber
- Patent number 9,997,328
- Issue date Jun 12, 2018
- Applied Materials Israel Ltd.
- Michael R. Rice
- G02 - OPTICS
Information Patent Grant
Evaluation system and a method for evaluating a substrate
- Patent number 9,835,563
- Issue date Dec 5, 2017
- Applied Materials Israel Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting an object with an array of beams
- Patent number 9,784,689
- Issue date Oct 10, 2017
- Applied Materials Israel Ltd.
- Ido Almog
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting a sample using landing lens
- Patent number 9,297,692
- Issue date Mar 29, 2016
- Applied Materials Israel, Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 8,134,699
- Issue date Mar 13, 2012
- Applied Materials, Inc.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
High resolution wafer inspection system
- Patent number 7,973,919
- Issue date Jul 5, 2011
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 7,924,419
- Issue date Apr 12, 2011
- Applied Materials Israel, Ltd.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
High resolution wafer inspection system
- Patent number 7,714,999
- Issue date May 11, 2010
- Applied Materials Israel, Ltd.
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for optical inspection
- Patent number 7,630,069
- Issue date Dec 8, 2009
- Applied Materials, Inc.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
Cascaded image intensifier
- Patent number 7,498,557
- Issue date Mar 3, 2009
- Applied Materials Israel Ltd.
- Iddo Pinkas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spot grid array scanning system
- Patent number 7,468,506
- Issue date Dec 23, 2008
- Applied Materials, Israel, Ltd.
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Process and assembly for non-destructive surface inspection
- Patent number 7,463,351
- Issue date Dec 9, 2008
- Applied Materials, Inc.
- Gilad Almogy
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for detecting defects
- Patent number 7,460,221
- Issue date Dec 2, 2008
- Applied Materials, Inc.
- Boris Goldberg
- G01 - MEASURING TESTING
Information Patent Grant
Integrated in situ scanning electronic microscope review station in...
- Patent number 7,428,850
- Issue date Sep 30, 2008
- Applied Materials, Israel,Ltd.
- Ron Naftali
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for detecting defects
- Patent number 7,268,343
- Issue date Sep 11, 2007
- Applied Materials, Inc.
- Boris Goldberg
- G01 - MEASURING TESTING
Information Patent Grant
Hardware configuration for parallel data processing without cross c...
- Patent number 7,184,612
- Issue date Feb 27, 2007
- Applied Materials, Inc.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for detecting defects
- Patent number 7,173,694
- Issue date Feb 6, 2007
- Applied Materials, Inc.
- Boris Goldberg
- G01 - MEASURING TESTING
Information Patent Grant
Amplifier circuit with a switching device to provide a wide dynamic...
- Patent number 7,109,463
- Issue date Sep 19, 2006
- Applied Materials, Inc.
- Erel Milshtein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer defect detection system with traveling lens multi-beam scanner
- Patent number 7,053,395
- Issue date May 30, 2006
- Applied Materials, Inc.
- Haim Feldman
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for detecting defects
- Patent number 7,053,999
- Issue date May 30, 2006
- Applied Materials, Inc.
- Boris Goldberg
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspection of a substrate that has a refracti...
- Patent number 7,030,978
- Issue date Apr 18, 2006
- Applied Materials, Israel, Ltd.
- Avishay Guetta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE ELECTRON BEAM OPTICS
- Publication number 20240387140
- Publication date Nov 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULT...
- Publication number 20240280506
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Elad EIZNER
- G01 - MEASURING TESTING
Information Patent Application
LASER PULSE CASCADE
- Publication number 20240280802
- Publication date Aug 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris GOLBERG
- G02 - OPTICS
Information Patent Application
POLARIZATION OPTICAL SYSTEM
- Publication number 20240255770
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Boris GOLBERG
- G01 - MEASURING TESTING
Information Patent Application
MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUC...
- Publication number 20240248046
- Publication date Jul 25, 2024
- Applied Materials, Inc.
- Keith Wells
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-MULTI-DIE WAFER INSPECTION
- Publication number 20230107630
- Publication date Apr 6, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ron Naftali
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20220392735
- Publication date Dec 8, 2022
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING OBJECTS
- Publication number 20210151214
- Publication date May 20, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Igor Krivts (Krayvitz)
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR EVALUATING A REGION OF AN OBJECT
- Publication number 20200051777
- Publication date Feb 13, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Ofer Shneyour
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROLLING AN INTENSITY PROFILE OF AN ENERGY BEAM WITH A DEFORMABL...
- Publication number 20180029126
- Publication date Feb 1, 2018
- Hou T. Ng
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
CONTROLLING AN INTENSITY PROFILE OF AN ENERGY BEAM IN ADDITIVE MANU...
- Publication number 20180029127
- Publication date Feb 1, 2018
- Hou T. Ng
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
CHUCK FOR SUPPORTING A WAFER
- Publication number 20170309511
- Publication date Oct 26, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Doron Korngut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR INSPECTING A SAMPLE BY USING A PLU...
- Publication number 20170307539
- Publication date Oct 26, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Application
SCANNING AN OBJECT USING MULTIPLE MECHANICAL STAGES
- Publication number 20170084425
- Publication date Mar 23, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Yoram Uziel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INSPECTING AN OBJECT WITH AN ARRAY OF BEAMS
- Publication number 20170010219
- Publication date Jan 12, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Ido Almog
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR FORMING A SEALED CHAMBER
- Publication number 20160268097
- Publication date Sep 15, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Michael R. Rice
- G02 - OPTICS
Information Patent Application
EVALUATION SYSTEM AND A METHOD FOR EVALUATING A SUBSTRATE
- Publication number 20160077016
- Publication date Mar 17, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING A SAMPLE USING LANDING LENS
- Publication number 20140231632
- Publication date Aug 21, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Yoram Uziel
- G02 - OPTICS
Information Patent Application
ILLUMINATION SYSTEM FOR OPTICAL INSPECTION
- Publication number 20110170090
- Publication date Jul 14, 2011
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION SYSTEM FOR OPTICAL INSPECTION
- Publication number 20100097680
- Publication date Apr 22, 2010
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
Cascaded image intensifier
- Publication number 20080272280
- Publication date Nov 6, 2008
- APPLIED MATERIALS ISRAEL LTD.
- Iddo Pinkas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION WAFER INSPECTION SYSTEM
- Publication number 20080231845
- Publication date Sep 25, 2008
- Dan Grossman
- G01 - MEASURING TESTING
Information Patent Application
System and method for printing a pattern
- Publication number 20080151209
- Publication date Jun 26, 2008
- Ron Naftali
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR DETECTING DEFECTS
- Publication number 20070195315
- Publication date Aug 23, 2007
- Boris Goldberg
- G01 - MEASURING TESTING
Information Patent Application
Optical spot grid array scanning system
- Publication number 20070133077
- Publication date Jun 14, 2007
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Integrated in situ scanning electronic microscope review station in...
- Publication number 20070022831
- Publication date Feb 1, 2007
- Ron Naftali
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Illumination system for optical inspection
- Publication number 20070008519
- Publication date Jan 11, 2007
- APPLIED MATERIALS, INC.
- Ron Naftali
- G01 - MEASURING TESTING
Information Patent Application
Spot grid array scanning system
- Publication number 20060261261
- Publication date Nov 23, 2006
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Method and system for detecting defects
- Publication number 20060152717
- Publication date Jul 13, 2006
- Boris Goldberg
- G01 - MEASURING TESTING
Information Patent Application
Method and system for detecting defects
- Publication number 20050200839
- Publication date Sep 15, 2005
- APPLIED MATERIALS, INC.
- Boris Goldberg
- G02 - OPTICS

Ron Naftali

Person

Patents Grantslast 30 patents

Die-to-multi-die wafer inspection

Method and system for evaluating objects

Method for evaluating a region of an object

Chuck for supporting a wafer

Controlling an intensity profile of an energy beam in additive manu...

Controlling an intensity profile of an energy beam with a deformabl...

Scanning an object using multiple mechanical stages

Near-field sensor height control

Inspection system and method for inspecting a sample by using a plu...

System and method for forming a sealed chamber

Evaluation system and a method for evaluating a substrate

Method and system for inspecting an object with an array of beams

System and method for inspecting a sample using landing lens

Illumination system for optical inspection

High resolution wafer inspection system

Illumination system for optical inspection

High resolution wafer inspection system

Illumination system for optical inspection

Cascaded image intensifier

Spot grid array scanning system

Process and assembly for non-destructive surface inspection

Method and system for detecting defects

Integrated in situ scanning electronic microscope review station in...

Method and system for detecting defects

Hardware configuration for parallel data processing without cross c...

Method and system for detecting defects

Amplifier circuit with a switching device to provide a wide dynamic...

Wafer defect detection system with traveling lens multi-beam scanner

Method and system for detecting defects

System and method for inspection of a substrate that has a refracti...

Patents Applicationslast 30 patents

MULTIPLE ELECTRON BEAM OPTICS

OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULT...

LASER PULSE CASCADE

POLARIZATION OPTICAL SYSTEM

MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUC...

DIE-TO-MULTI-DIE WAFER INSPECTION

METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE BEAM DEVICE

METHOD AND SYSTEM FOR EVALUATING OBJECTS

METHOD FOR EVALUATING A REGION OF AN OBJECT

CONTROLLING AN INTENSITY PROFILE OF AN ENERGY BEAM WITH A DEFORMABL...

CONTROLLING AN INTENSITY PROFILE OF AN ENERGY BEAM IN ADDITIVE MANU...

CHUCK FOR SUPPORTING A WAFER

INSPECTION SYSTEM AND METHOD FOR INSPECTING A SAMPLE BY USING A PLU...

SCANNING AN OBJECT USING MULTIPLE MECHANICAL STAGES

METHOD FOR INSPECTING AN OBJECT WITH AN ARRAY OF BEAMS

SYSTEM AND METHOD FOR FORMING A SEALED CHAMBER

EVALUATION SYSTEM AND A METHOD FOR EVALUATING A SUBSTRATE

SYSTEM AND METHOD FOR INSPECTING A SAMPLE USING LANDING LENS

ILLUMINATION SYSTEM FOR OPTICAL INSPECTION

ILLUMINATION SYSTEM FOR OPTICAL INSPECTION

Cascaded image intensifier

HIGH RESOLUTION WAFER INSPECTION SYSTEM

System and method for printing a pattern

METHOD AND SYSTEM FOR DETECTING DEFECTS

Optical spot grid array scanning system

Integrated in situ scanning electronic microscope review station in...

Illumination system for optical inspection

Spot grid array scanning system

Method and system for detecting defects

Method and system for detecting defects