Membership
Tour
Register
Log in
Ronald A. Roberts
Follow
Person
Ames, IA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Microtexture region characterization systems and methods
Patent number
11,933,767
Issue date
Mar 19, 2024
RTX Corporation
Yong Tian
G01 - MEASURING TESTING
Information
Patent Grant
Microtexture region characterization systems and methods
Patent number
11,788,992
Issue date
Oct 17, 2023
RTX Corporation
Yong Tian
G01 - MEASURING TESTING
Information
Patent Grant
Microtexture region characterization systems and methods
Patent number
11,467,133
Issue date
Oct 11, 2022
Raytheon Technologies Corporation
Yong Tian
G01 - MEASURING TESTING
Information
Patent Grant
Microtexture region characterization systems and methods
Patent number
11,333,633
Issue date
May 17, 2022
Raytheon Technologies Corporation
Yong Tian
G01 - MEASURING TESTING
Information
Patent Grant
Leak detection using structure-borne noise
Patent number
7,739,899
Issue date
Jun 22, 2010
Iowa State University Research Foundation, Inc.
Stephen D. Holland
G01 - MEASURING TESTING
Information
Patent Grant
System and method to provide material property measurement using re...
Patent number
6,601,451
Issue date
Aug 5, 2003
Iowa State University Research Foundation
Ronald Allen Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining source location of energy carr...
Patent number
6,138,512
Issue date
Oct 31, 2000
Iowa State University Research Foundation, Inc.
Ronald A. Roberts
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MICROTEXTURE REGION CHARACTERIZATION SYSTEMS AND METHODS
Publication number
20230003694
Publication date
Jan 5, 2023
Raytheon Technologies Corporation
Yong Tian
G01 - MEASURING TESTING
Information
Patent Application
MICROTEXTURE REGION CHARACTERIZATION SYSTEMS AND METHODS
Publication number
20220276205
Publication date
Sep 1, 2022
Iowa State University Research Foundation, Inc.
Yong Tian
G01 - MEASURING TESTING
Information
Patent Application
MICROTEXTURE REGION CHARACTERIZATION SYSTEMS AND METHODS
Publication number
20210072197
Publication date
Mar 11, 2021
United Technologies Corporation
Yong Tian
G01 - MEASURING TESTING
Information
Patent Application
MICROTEXTURE REGION CHARACTERIZATION SYSTEMS AND METHODS
Publication number
20210072192
Publication date
Mar 11, 2021
United Technologies Corporation
Yong Tian
G01 - MEASURING TESTING