Ronald B. Jones

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Mundelein, IL, US

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Patents Grantslast 30 patents

Information Patent Grant
Multi-band focal plane array
- Patent number 7,592,593
- Issue date Sep 22, 2009
- Northrop Grumman Corporation
- Christopher Lee Kauffman
- G01 - MEASURING TESTING
Information Patent Grant
Target illuminating beam steering device
- Patent number 7,058,277
- Issue date Jun 6, 2006
- Northrop Grumman Corporation
- Curtis J. Harkrider
- G02 - OPTICS
Information Patent Grant
Automated sample handling for X-ray crystallography
- Patent number 6,608,883
- Issue date Aug 19, 2003
- Abbott Laboratories
- Jeffrey A. Olson
- G01 - MEASURING TESTING
Information Patent Grant
Automated sample handling for X-ray crystallography
- Patent number 6,404,849
- Issue date Jun 11, 2002
- Abbott Laboratories
- Jeffrey A. Olson
- G01 - MEASURING TESTING
Information Patent Grant
Solid-state laser system using high-temperature semiconductor diode...
- Patent number 6,363,095
- Issue date Mar 26, 2002
- Northrop Grumman Corporation
- Ronald B. Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Varied intensity and/or infrared auxiliary illumination of surveill...
- Patent number 5,973,730
- Issue date Oct 26, 1999
- Northrop Grumman Corporation
- Charles J. Tranchita
- G08 - SIGNALLING
Information Patent Grant
Varied intensity and/or infrared auxiliary illumination of surveill...
- Patent number 5,739,847
- Issue date Apr 14, 1998
- Northrop Grumman Corporation
- Charles J. Tranchita
- G08 - SIGNALLING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-BAND FOCAL PLANE ARRAY
- Publication number 20090173883
- Publication date Jul 9, 2009
- Northrop Grumman Corporation
- Christopher Lee Kauffman
- G01 - MEASURING TESTING
Information Patent Application
Automated sample handling for X-ray crystallography
- Publication number 20040048391
- Publication date Mar 11, 2004
- Jeffrey A. Olson
- G01 - MEASURING TESTING
Information Patent Application
Automated sample handling for X-ray crystallography
- Publication number 20020126802
- Publication date Sep 12, 2002
- Jeffrey A. Olson
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SAMPLE HANDLING FOR X-RAY CRYSTALLOGRAPHY
- Publication number 20020054663
- Publication date May 9, 2002
- JEFFREY A. OLSON
- G01 - MEASURING TESTING