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Ronald B. Leonardson
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Redmond, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
MEMS teeter-totter accelerometer having reduced non-linearty
Patent number
7,140,250
Issue date
Nov 28, 2006
Honeywell International Inc.
Ronald B. Leonardson
G01 - MEASURING TESTING
Information
Patent Grant
MEMS enhanced capacitive pick-off and electrostatic rebalance elect...
Patent number
6,841,992
Issue date
Jan 11, 2005
Honeywell International, Inc.
Aiwu Yue
G01 - MEASURING TESTING
Information
Patent Grant
Compensation of second-order non-linearity in sensors employing dou...
Patent number
6,718,292
Issue date
Apr 6, 2004
Honeywell International Inc.
Graeme A. Blake
G01 - MEASURING TESTING
Information
Patent Grant
Small size, high capacitance readout silicon based MEMS accelerometer
Patent number
6,705,166
Issue date
Mar 16, 2004
Honeywell International, Inc.
Ronald B. Leonardson
G01 - MEASURING TESTING
Information
Patent Grant
Compensation of second-order non-linearity in sensors employing dou...
Patent number
6,282,959
Issue date
Sep 4, 2001
AlliedSignal
Graeme A. Blake
G01 - MEASURING TESTING
Information
Patent Grant
Combined enhanced shock load capability and stress isolation struct...
Patent number
6,257,060
Issue date
Jul 10, 2001
AlliedSignal Inc.
Ronald B. Leonardson
G01 - MEASURING TESTING
Information
Patent Grant
Vibrating beam accelerometer and method for manufacturing the same
Patent number
6,248,610
Issue date
Jun 19, 2001
AlliedSignal Inc.
Ronald B. Leonardson
G01 - MEASURING TESTING
Information
Patent Grant
Vibrating beam accelerometer and method for manufacturing the same
Patent number
5,996,411
Issue date
Dec 7, 1999
AlliedSignal Inc.
Ronald B. Leonardson
G01 - MEASURING TESTING
Information
Patent Grant
Vibrating beam accelerometers and methods of forming vibrating beam...
Patent number
5,948,982
Issue date
Sep 7, 1999
AlliedSignal Inc.
James R. Woodruff
G01 - MEASURING TESTING
Information
Patent Grant
Inertial reference system
Patent number
4,675,820
Issue date
Jun 23, 1987
Sundstrand Data Control, Inc.
Jeffrey T. Smith
G01 - MEASURING TESTING
Information
Patent Grant
Digital accelerometer
Patent number
4,620,442
Issue date
Nov 4, 1986
Sundstrand Data Control, Inc.
Douglas C. MacGugan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEMS teeter-totter accelerometer having reduced non-linearty
Publication number
20060185433
Publication date
Aug 24, 2006
Honeywell International, Inc.
Ronald B. Leonardson
G01 - MEASURING TESTING
Information
Patent Application
MEMS enhanced capacitive pick-off and electrostatic rebalance elect...
Publication number
20040160232
Publication date
Aug 19, 2004
Honeywell International, Inc.
Aiwu Yue
G01 - MEASURING TESTING
Information
Patent Application
Small size, high capacitance readout silicon based MEMS accelerometer
Publication number
20020189355
Publication date
Dec 19, 2002
Honeywell International, Inc.
Ronald B. Leonardson
G01 - MEASURING TESTING