Ronald E. Frye Jr.

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Newman, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical scan and alignment of devices under test
- Patent number 5,481,202
- Issue date Jan 2, 1996
- VLSI Technology, Inc.
- Ronald E. Frye
- G01 - MEASURING TESTING
Information Patent Grant
System for controlling an integrated product process for semiconduc...
- Patent number 5,355,320
- Issue date Oct 11, 1994
- VLSI Technology, Inc.
- Scott A. Erjavic
- G05 - CONTROLLING REGULATING