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Ronald Henricus Johannes OTTEN
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Rosmalen, NL
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Patents Grants
last 30 patents
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Patent Grant
Methods of determining stress in a substrate, control system for co...
Patent number
11,300,888
Issue date
Apr 12, 2022
ASML Netherlands B.V.
Richard Johannes Franciscus Van Haren
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology apparatus
Patent number
11,300,889
Issue date
Apr 12, 2022
ASML Netherlands B.V.
Leon Paul Van Dijk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Methods and apparatus for use in a device manufacturing method
Patent number
11,226,567
Issue date
Jan 18, 2022
ASML Netherlands B.V.
Richard Johannes Franciscus Van Haren
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus, device manufacturing method and associated...
Patent number
10,545,410
Issue date
Jan 28, 2020
ASML Netherlands B.V.
Hakki Ergun Cekli
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
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Patent Application
METROLOGY APPARATUS
Publication number
20210165335
Publication date
Jun 3, 2021
ASML NETHERLANDS B.V.
Leon Paul VAN DIJK
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHODS AND APPARATUS FOR USE IN A DEVICE MANUFACTURING METHOD
Publication number
20200218169
Publication date
Jul 9, 2020
ASML NETHERLANDS B.V.
Richard Johannes Franciscus VAN HAREN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHODS OF DETERMINING STRESS IN A SUBSTRATE, CONTROL SYSTEM FOR CO...
Publication number
20200050117
Publication date
Feb 13, 2020
ASML NETHERLANDS B.V.
Richard Johannes Franciscus VAN HAREN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD AND ASSOCIATED...
Publication number
20190079411
Publication date
Mar 14, 2019
ASML NETHERLANDS B.V.
Hakki Ergun CEKLI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHODS OF DETERMINING A MECHANICAL PROPERTY OF A LAYER APPLIED TO...
Publication number
20190041758
Publication date
Feb 7, 2019
ASML NETHERLANDS B.V.
Leon Paul VAN DIJK
G01 - MEASURING TESTING