Ronald Hoyer

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated multi-layer test pads and methods therefor
- Patent number 5,981,302
- Issue date Nov 9, 1999
- Siemens Aktiengesellschaft
- Frank Alswede
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to minimize watermarks on silicon substrates
- Patent number 5,932,493
- Issue date Aug 3, 1999
- International Business Machines Corporaiton
- Hiroyuki Akatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated multi-layer test pads
- Patent number 5,917,197
- Issue date Jun 29, 1999
- Siemens Aktiengesellschaft
- Frank Alswede
- H01 - BASIC ELECTRIC ELEMENTS