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RONALD J. LARRICK
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BEAVERTON, OR, US
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last 30 patents
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Patent Grant
Apparatus and methods of defining spectral regions of interest for...
Patent number
7,920,990
Issue date
Apr 5, 2011
Tektronix, Inc.
Richard B. Nicholls
G01 - MEASURING TESTING
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Patent Grant
Low frequency suppression circuit for a time domain reflectometer
Patent number
6,124,717
Issue date
Sep 26, 2000
Tektronix, Inc.
Edgar T. Guenther
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
APPARATUS AND METHODS OF DEFINING SPECTRAL REGIONS OF INTEREST FOR...
Publication number
20090125259
Publication date
May 14, 2009
Tektronix, Inc.
RICHARD B. NICHOLLS
G01 - MEASURING TESTING