Ronald J. Rieder

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Medford, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Doubly-differential interferometer and method for evanescent wave s...
- Patent number 6,330,064
- Issue date Dec 11, 2001
- SatCon Technology Corporation
- Ronald J. Rieder
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and method for rapid detection of metabolic deviations of a...
- Publication number 20050142537
- Publication date Jun 30, 2005
- Ronald Rieder
- G01 - MEASURING TESTING
Information Patent Application
DOUBLY-DIFFERENTIAL INTERFEROMETER AND METHOD FOR EVANESCENT WAVE S...
- Publication number 20020003627
- Publication date Jan 10, 2002
- Ronald J. Rieder
- G01 - MEASURING TESTING