Ronald Jay Bolam

Person

East Fairfield, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Monitoring aging of silicon in an integrated circuit device
- Patent number 9,310,424
- Issue date Apr 12, 2016
- International Business Machines Corporation
- Malcolm S. Allen-Ware
- G01 - MEASURING TESTING
Information Patent Grant
Managing aging of silicon in an integrated circuit device
- Patent number 8,713,490
- Issue date Apr 29, 2014
- International Business Machines Corporation
- Malcolm S. Allen-Ware
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure for creation of a metal insulator metal capacitor
- Patent number 8,227,849
- Issue date Jul 24, 2012
- International Business Machines Corporation
- Ebenezer E. Eshun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Design structure for semiconductor on-chip repair scheme for negati...
- Patent number 7,890,893
- Issue date Feb 15, 2011
- International Business Machines Corporation
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor on-chip repair scheme for negative bias temperature i...
- Patent number 7,838,958
- Issue date Nov 23, 2010
- International Business Machines Corporation
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for creation of a metal insulator metal capacitor
- Patent number 7,728,372
- Issue date Jun 1, 2010
- International Business Machines Corporation
- Ebenezer E. Eshun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for correcting for asymmetry of threshold voltage shifts
- Patent number 7,541,829
- Issue date Jun 2, 2009
- International Business Machines Corporation
- Ronald J. Bolam
- G01 - MEASURING TESTING
Information Patent Grant
Silicon-on-insulator chip having an isolation barrier for reliability
- Patent number RE40339
- Issue date May 27, 2008
- International Business Machines Corporation
- Ronald J. Bolam
- 257 - Active solid-state devices
Information Patent Grant
Circuitry and methodology to establish correlation between gate die...
- Patent number 7,298,161
- Issue date Nov 20, 2007
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Circuitry and methodology to establish correlation between gate die...
- Patent number 6,891,359
- Issue date May 10, 2005
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Grant
Method and testing circuit for tracking transistor stress degradation
- Patent number 6,879,177
- Issue date Apr 12, 2005
- International Business Machines Corporation
- Ronald Jay Bolam
- G01 - MEASURING TESTING
Information Patent Grant
Silicon-on-insulator chip having an isolation barrier for reliability
- Patent number 6,563,173
- Issue date May 13, 2003
- International Business Machines Corporation
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon-on-insulator chip having an isolation barrier for reliability
- Patent number 6,492,684
- Issue date Dec 10, 2002
- International Business Machines Corporation
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI pass gate leakage monitor
- Patent number 6,437,594
- Issue date Aug 20, 2002
- International Business Machines Corporation
- Ronald J. Bolam
- G01 - MEASURING TESTING
Information Patent Grant
Process of manufacturing silicon-on-insulator chip having an isolat...
- Patent number 6,281,095
- Issue date Aug 28, 2001
- International Business Machines Corporation
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabrication of silicon on insulator substrates
- Patent number 6,239,469
- Issue date May 29, 2001
- International Business Machines Corporation
- Ronald Jay Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabrication of silicon on insulator substrates
- Patent number 6,194,253
- Issue date Feb 27, 2001
- International Business Machines Corporation
- Ronald Jay Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon-on-insulator chip having an isolation barrier for reliabili...
- Patent number 6,133,610
- Issue date Oct 17, 2000
- International Business Machines Corporation
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for charge enhanced defect breakdown to improve yield and re...
- Patent number 5,804,459
- Issue date Sep 8, 1998
- International Business Machines Corporation
- Ronald Jay Bolam
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Monitoring Aging of Silicon in an Integrated Circuit Device
- Publication number 20140244212
- Publication date Aug 28, 2014
- International Business Machines Corporation
- Malcolm S. Allen-Ware
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND STRUCTURE FOR CREATION OF A METAL INSULATOR METAL CAPACITOR
- Publication number 20100149723
- Publication date Jun 17, 2010
- International Business Machines Corporation
- EBENEZER E. ESHUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE FOR SEMICONDUCTOR ON-CHIP REPAIR SCHEME FOR NEGATIVE BIAS...
- Publication number 20090183131
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor On-Chip Repair Scheme for Negative Bias Temperature I...
- Publication number 20090179689
- Publication date Jul 16, 2009
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONITORING DEGRADATION OF CIRCIUT SPEED
- Publication number 20090063061
- Publication date Mar 5, 2009
- International Business Machines Corporation
- RONALD J. BOLAM
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND STRUCTURE FOR CREATION OF A METAL INSULATOR METAL CAPACITOR
- Publication number 20070262416
- Publication date Nov 15, 2007
- International Business Machines Corporation
- Ebenezer E. Eshun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuitry and methodology to establish correlation between gate die...
- Publication number 20050184720
- Publication date Aug 25, 2005
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
Circuitry And Methodology To Establish Correlation Between Gate Die...
- Publication number 20040145384
- Publication date Jul 29, 2004
- International Business Machines Corporation
- Kerry Bernstein
- G01 - MEASURING TESTING
Information Patent Application
Silicon-on-insulator chip having an isolation barrier for reliability
- Publication number 20020043686
- Publication date Apr 18, 2002
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Silicon-on-insulator chip having an isolation barrier for reliability
- Publication number 20010024863
- Publication date Sep 27, 2001
- Ronald J. Bolam
- H01 - BASIC ELECTRIC ELEMENTS

Ronald Jay Bolam

Person

Patents Grantslast 30 patents

Monitoring aging of silicon in an integrated circuit device

Managing aging of silicon in an integrated circuit device

Method and structure for creation of a metal insulator metal capacitor

Design structure for semiconductor on-chip repair scheme for negati...

Semiconductor on-chip repair scheme for negative bias temperature i...

Method and structure for creation of a metal insulator metal capacitor

Method for correcting for asymmetry of threshold voltage shifts

Silicon-on-insulator chip having an isolation barrier for reliability

Circuitry and methodology to establish correlation between gate die...

Circuitry and methodology to establish correlation between gate die...

Method and testing circuit for tracking transistor stress degradation

Silicon-on-insulator chip having an isolation barrier for reliability

Silicon-on-insulator chip having an isolation barrier for reliability

SOI pass gate leakage monitor

Process of manufacturing silicon-on-insulator chip having an isolat...

Method for fabrication of silicon on insulator substrates

Method for fabrication of silicon on insulator substrates

Silicon-on-insulator chip having an isolation barrier for reliabili...

Method for charge enhanced defect breakdown to improve yield and re...

Patents Applicationslast 30 patents

Monitoring Aging of Silicon in an Integrated Circuit Device

METHOD AND STRUCTURE FOR CREATION OF A METAL INSULATOR METAL CAPACITOR

STRUCTURE FOR SEMICONDUCTOR ON-CHIP REPAIR SCHEME FOR NEGATIVE BIAS...

Semiconductor On-Chip Repair Scheme for Negative Bias Temperature I...

MONITORING DEGRADATION OF CIRCIUT SPEED

METHOD AND STRUCTURE FOR CREATION OF A METAL INSULATOR METAL CAPACITOR

Circuitry and methodology to establish correlation between gate die...

Circuitry And Methodology To Establish Correlation Between Gate Die...

Silicon-on-insulator chip having an isolation barrier for reliability

Silicon-on-insulator chip having an isolation barrier for reliability