Ronald Jay Prilik

Person

Annandale, VA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wafer test and burn-in
- Patent number 6,351,134
- Issue date Feb 26, 2002
- International Business Machines Corporation
- James Marc Leas
- G01 - MEASURING TESTING
Information Patent Grant
Self-timed AC CIO wrap method and apparatus
- Patent number 6,058,496
- Issue date May 2, 2000
- International Business Machines Corporation
- Pamela Sue Gillis
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer test and burn-in
- Patent number 5,929,651
- Issue date Jul 27, 1999
- International Business Machines Corporation
- James Marc Leas
- G01 - MEASURING TESTING
Information Patent Grant
Method and built-in self-test apparatus for testing an integrated c...
- Patent number 5,912,901
- Issue date Jun 15, 1999
- International Business Machines Corporation
- R. Dean Adams
- G01 - MEASURING TESTING
Information Patent Grant
Multi-layer printed circuit board
- Patent number 4,928,061
- Issue date May 22, 1990
- International Business Machines Corporation
- Michael S. Dampier
- G01 - MEASURING TESTING
Information Patent Grant
Read/write memory device with an embedded read-only pattern and met...
- Patent number 4,841,485
- Issue date Jun 20, 1989
- International Business Machines Corporation
- Ronald J. Prilik
- G11 - INFORMATION STORAGE
Information Patent Grant
Fast recovery power supply
- Patent number 4,686,462
- Issue date Aug 11, 1987
- International Business Machines Corporation
- Ronald J. Prilik
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automatic tester for complex semiconductor components including com...
- Patent number 4,044,244
- Issue date Aug 23, 1977
- International Business Machines Corporation
- Steven H. Foreman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR WAFER TEST AND BURN-IN
- Publication number 20020003432
- Publication date Jan 10, 2002
- JAMES MARC LEAS
- G01 - MEASURING TESTING

Ronald Jay Prilik

Person

Patents Grantslast 30 patents

Semiconductor wafer test and burn-in

Self-timed AC CIO wrap method and apparatus

Semiconductor wafer test and burn-in

Method and built-in self-test apparatus for testing an integrated c...

Multi-layer printed circuit board

Read/write memory device with an embedded read-only pattern and met...

Fast recovery power supply

Automatic tester for complex semiconductor components including com...

Patents Applicationslast 30 patents

SEMICONDUCTOR WAFER TEST AND BURN-IN