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Shielded x-ray detector
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Patent number 7,362,846
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Issue date Apr 22, 2008
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Agilent Technologies, Inc.
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Ronald K Kerschner
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G01 - MEASURING TESTING
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Shielded x-ray detector
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Patent number 6,853,707
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Issue date Feb 8, 2005
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Agilent Technologies, Inc.
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Ronald K Kerschner
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G01 - MEASURING TESTING
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Capacitive test probe
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Patent number D344464
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Issue date Feb 22, 1994
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Hewlett-Packard Company
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Ronald K. Kerschner
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D10 - Measuring, testing, or signalling instruments
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Capacitive test probe board
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Patent number D344030
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Issue date Feb 8, 1994
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Hewlett-Packard Company
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Ronald K. Kerschner
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D10 - Measuring, testing, or signalling instruments
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Board fixturing system
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Patent number 4,818,933
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Issue date Apr 4, 1989
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Hewlett-Packard Company
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Ronald K. Kerschner
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G01 - MEASURING TESTING