Ronald K. Minemier

Person

Tempe, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical transmission of test data for testing integrated circuits
- Patent number 9,535,111
- Issue date Jan 3, 2017
- Intel Corporation
- Ronald K. Minemier
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit testing architecture
- Patent number 9,506,980
- Issue date Nov 29, 2016
- Intel Corporation
- Abram M. Detofsky
- G01 - MEASURING TESTING
Information Patent Grant
Detection mechanism
- Patent number 7,509,541
- Issue date Mar 24, 2009
- Intel Corporation
- Ronald K. Minemier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensing with defective cell detection
- Patent number 7,126,631
- Issue date Oct 24, 2006
- Intel Corporation
- Ronald K. Minemier
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Reducing dark current noise in an imaging system
- Patent number 6,614,562
- Issue date Sep 2, 2003
- Intel Corporation
- Ronald K. Minemier
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Stacked die integrated circuit device
- Patent number 6,229,158
- Issue date May 8, 2001
- Intel Corporation
- Ronald K. Minemier
- G02 - OPTICS
Information Patent Grant
Stacked die integrated circuit device
- Patent number 6,093,938
- Issue date Jul 25, 2000
- Intel Corporation
- Ronald K. Minemier
- G02 - OPTICS
Information Patent Grant
Apparatus and method for defective column detection for semiconduct...
- Patent number 5,400,343
- Issue date Mar 21, 1995
- Intel Corporation
- Brent S. Crittenden
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT TESTING ARCHITECTURE
- Publication number 20140266285
- Publication date Sep 18, 2014
- Abram M. DETOFSKY
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TRANSMISSION OF TEST DATA FOR TESTING INTEGRATED CIRCUITS
- Publication number 20140203837
- Publication date Jul 24, 2014
- Ronald K. Minemier
- G01 - MEASURING TESTING
Information Patent Application
DC Testing Integrated Circuits
- Publication number 20110148429
- Publication date Jun 23, 2011
- Ronald K. Minemier
- G01 - MEASURING TESTING
Information Patent Application
Detection mechanism
- Publication number 20060010346
- Publication date Jan 12, 2006
- Ronald K. Minemier
- G06 - COMPUTING CALCULATING COUNTING

Ronald K. Minemier

Person

Patents Grantslast 30 patents

Optical transmission of test data for testing integrated circuits

Integrated circuit testing architecture

Detection mechanism

Sensing with defective cell detection

Reducing dark current noise in an imaging system

Stacked die integrated circuit device

Stacked die integrated circuit device

Apparatus and method for defective column detection for semiconduct...

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT TESTING ARCHITECTURE

OPTICAL TRANSMISSION OF TEST DATA FOR TESTING INTEGRATED CIRCUITS

DC Testing Integrated Circuits

Detection mechanism