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last 30 patents
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Patent Grant
Reduced-pin-count-testing architectures for applying test patterns
Patent number
7,487,419
Issue date
Feb 3, 2009
Nilanjan Mukherjee
G01 - MEASURING TESTING
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Circuit for switching between multiple clocks
Patent number
6,452,426
Issue date
Sep 17, 2002
Nagesh Tamarapalli
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
Reduced-pin-count-testing architectures for applying test patterns
Publication number
20070011542
Publication date
Jan 11, 2007
Nilanjan Mukherjee
G01 - MEASURING TESTING