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Ronald Raymond Palmer
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Westford, VT, US
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last 30 patents
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Patent Grant
Testable programmable gate array and associated LSSD/deterministic...
Patent number
6,021,513
Issue date
Feb 1, 2000
International Business Machines Corporation
Wayne Kevin Beebe
G01 - MEASURING TESTING
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Patent Grant
Testable programmable gate array and associated LSSD/deterministic...
Patent number
5,867,507
Issue date
Feb 2, 1999
International Business Machines Corporation
Wayne Kevin Beebe
G01 - MEASURING TESTING
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Patent Grant
Programmable array I/O-routing resource
Patent number
5,671,432
Issue date
Sep 23, 1997
International Business Machines Corporation
Allan Robert Bertolet
H03 - BASIC ELECTRONIC CIRCUITRY