Ronald V. Alves

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Palo Alto, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring the thickness of a film using lo...
- Patent number 5,642,196
- Issue date Jun 24, 1997
- Hewlett-Packard Company
- Ronald V. Alves
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexing and calibration techniques for optical signal measurin...
- Patent number 4,558,217
- Issue date Dec 10, 1985
- Luxtron Corporation
- Ronald V. Alves
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for an instrument to detect the temperature of an op...
- Patent number 4,459,044
- Issue date Jul 10, 1984
- Luxtron Corporation
- Ronald V. Alves
- G01 - MEASURING TESTING