Ronald Victor Bravenec

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Stable surface wave plasma source
- Patent number 8,669,705
- Issue date Mar 11, 2014
- Tokyo Electron Limited
- Lee Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and system for characterizing a plasma
- Patent number 8,660,805
- Issue date Feb 25, 2014
- Tokyo Electron Limited
- Ronald Victor Bravenec
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Stable surface wave plasma source
- Patent number 8,415,884
- Issue date Apr 9, 2013
- Tokyo Electron Limited
- Lee Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ion energy analyzer and methods of manufacturing and operating
- Patent number 7,875,859
- Issue date Jan 25, 2011
- Tokyo Electron Limited
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-grid ion energy analyzer and methods of manufacturing and opera...
- Patent number 7,777,179
- Issue date Aug 17, 2010
- Tokyo Electron Limited
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
STABLE SURFACE WAVE PLASMA SOURCE
- Publication number 20130264938
- Publication date Oct 10, 2013
- TOKYO ELECTRON LIMITED
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR CHARACTERIZING A PLASMA
- Publication number 20120084026
- Publication date Apr 5, 2012
- TOKYO ELECTRON LIMITED
- Ronald Victor BRAVENEC
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Stable surface wave plasma source
- Publication number 20110057562
- Publication date Mar 10, 2011
- TOKYO ELECTRON LIMITED
- Lee CHEN
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ION ENERGY ANALYZER AND METHODS OF MANUFACTURING AND OPERATING
- Publication number 20090242790
- Publication date Oct 1, 2009
- TOKYO ELECTRON LIMITED
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-grid ion energy analyzer and methods of manufacturing and opera...
- Publication number 20090242791
- Publication date Oct 1, 2009
- TOKYO ELECTRON LIMITED
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS