Ronald W. Young

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Pocatello, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
High temperature range electrical circuit testing
- Patent number 7,816,930
- Issue date Oct 19, 2010
- ON Semiconductor
- Ronald W. Young
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH TEMPERATURE RANGE ELECTRICAL CIRCUIT TESTING
- Publication number 20090115437
- Publication date May 7, 2009
- AMI Semiconductor, Inc.
- Ronald W. Young
- G01 - MEASURING TESTING