TREA

Rondell Kenneth Watts

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  • Concord, NC, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Circuit trace probe and method
    • Patent number 6,401,048
    • Issue date Jun 4, 2002
    • International Business Machines Corporation
    • Raymond J. Caggiano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Positive side support test assembly
    • Patent number 6,252,413
    • Issue date Jun 26, 2001
    • International Business Machines Corporation
    • Rondell Kenneth Watts
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Circuit trace probe and method
    • Patent number 6,243,655
    • Issue date Jun 5, 2001
    • International Business Machines Corporation
    • Raymond J. Caggiano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Positive side support test assembly
    • Patent number 6,051,983
    • Issue date Apr 18, 2000
    • International Business Machines Corporation
    • Rondell Kenneth Watts
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probeless fixture for adapter card testing
    • Patent number 5,791,934
    • Issue date Aug 11, 1998
    • International Business Machines Corporation
    • Jeffrey Alan Hatley
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Circuit trace probe and method
    • Publication number 20010005817
    • Publication date Jun 28, 2001
    • Raymond J. Caggiano
    • G01 - MEASURING TESTING