Ronen Benzion

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Los Altos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe tip X-Y location identification using a charged particle beam
- Patent number 12,169,208
- Issue date Dec 17, 2024
- Innovatum Instruments Inc.
- Richard E Stallcup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Through process flow intra-chip and inter-chip electrical analysis...
- Patent number 10,539,589
- Issue date Jan 21, 2020
- FEI EFA, Inc.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED PROBE LANDING
- Publication number 20230258707
- Publication date Aug 17, 2023
- Innovatum Instruments Inc.
- Richard E Stallcup
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM
- Publication number 20230168274
- Publication date Jun 1, 2023
- Innovatum Instruments Inc.
- Richard E Stallcup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THROUGH PROCESS FLOW INTRA-CHIP AND INTER-CHIP ELECTRICAL ANALYSIS...
- Publication number 20150377921
- Publication date Dec 31, 2015
- DCG SYSTEMS, INC.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR NANOPROBING OF ELECTRONIC DEVICES
- Publication number 20150377958
- Publication date Dec 31, 2015
- DCG SYSTEMS, INC.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING