Ronen Loewinger

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San Francisco, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Electrical inspection of electronic devices using electron-beam ind...
- Patent number 9,523,714
- Issue date Dec 20, 2016
- Photon Dynamics, Inc.
- Alexander Kadyshevitch
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPLICATION OF eBIP TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICA...
- Publication number 20170294291
- Publication date Oct 12, 2017
- ORBOTECH LTD.
- Nedal SALEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPLICATION OF ELECTRON-BEAM INDUCED PLASMA PROBES TO INSPECTION, T...
- Publication number 20160299103
- Publication date Oct 13, 2016
- Photon Dynamics Inc.
- Nedal Saleh
- G01 - MEASURING TESTING
Information Patent Application
Electrical Inspection of Electronic Devices Using Electron-Beam Ind...
- Publication number 20140132299
- Publication date May 15, 2014
- Photon Dynamics, Inc.
- Alexander Kadyshevitch
- G01 - MEASURING TESTING