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Ronen-Pavel Urenski
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Bat-Yam, IL
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Patents Grants
last 30 patents
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Patent Grant
TEM-based metrology method and system
Patent number
10,916,404
Issue date
Feb 9, 2021
Nova Measuring Instruments Ltd.
Vladimir Machavariani
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Tailoring domain engineered structures in ferroelectric materials
Patent number
7,151,257
Issue date
Dec 19, 2006
Ramot At Tel-Aviv University Ltd.
Gil Rosenman
G01 - MEASURING TESTING
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Patent Grant
Tailoring domain engineered structures in ferroelectric materials
Patent number
6,653,630
Issue date
Nov 25, 2003
Ramot University Authority for Applied Research and Industrial Development Ltd.
Gil Rosenman
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
Publication number
20210217581
Publication date
Jul 15, 2021
NOVA MEASURING INSTRUMENTS LTD.
VLADIMIR MACHAVARIANI
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
METROLOGY METHOD AND SYSTEM
Publication number
20200294829
Publication date
Sep 17, 2020
NOVA MEASURING INSTRUMENTS LTD.
VLADIMIR MACHAVARIANI
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
Publication number
20190393016
Publication date
Dec 26, 2019
NOVA MEASURING INSTRUMENTS LTD.
VLADIMIR MACHAVARIANI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Tailoring domain engineered structures in ferroelectric materials
Publication number
20050023462
Publication date
Feb 3, 2005
Ramot at Tel-Aviv University Ltd.
Gil Rosenman
G02 - OPTICS