Rong Pan

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Aberdeen, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Wrap-back test system and method
- Patent number 5,956,370
- Issue date Sep 21, 1999
- LSI Logic Corporation
- Francois Ducaroir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Programmable synchronization character
- Patent number 5,896,426
- Issue date Apr 20, 1999
- LSI Logic Corporation
- Krishnan Ramamurthy
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Self test of core with unpredictable latency
- Patent number 5,790,563
- Issue date Aug 4, 1998
- LSI Logic Corp.
- Krishnan Ramamurthy
- G01 - MEASURING TESTING
Information Patent Grant
Loop-back test system and method
- Patent number 5,787,114
- Issue date Jul 28, 1998
- LSI Logic Corporation
- Krishnan Ramamurthy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed phase locked loop test method and means
- Patent number 5,781,038
- Issue date Jul 14, 1998
- LSI Logic Corporation
- Krishnan Ramamurthy
- G01 - MEASURING TESTING