Ronit Roneel Prakash

Person

Hiratsuka City, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sequential wordline erase verify schemes
- Patent number 12,002,524
- Issue date Jun 4, 2024
- Micron Technology, Inc.
- Ronit Roneel Prakash
- G11 - INFORMATION STORAGE
Information Patent Grant
Sequential wordline erase verify schemes
- Patent number 11,574,690
- Issue date Feb 7, 2023
- Micron Technology, Inc.
- Ronit Roneel Prakash
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
INVERSE ERASE FOR MEMORY COMPONENTS
- Publication number 20240361945
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Zhongguang Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC ERASE VOLTAGE STEP
- Publication number 20240281148
- Publication date Aug 22, 2024
- Micron Technology, Inc.
- Jiun-Horng Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RELIABILITY GAIN IN MEMORY DEVICES WITH ADAPTIVELY SELECTED ERASE P...
- Publication number 20240176508
- Publication date May 30, 2024
- Micron Technology, Inc.
- Yu-Chung Lien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZING DATA RELIABILITY USING ERASE RETENTION
- Publication number 20240176496
- Publication date May 30, 2024
- Micron Technology, Inc.
- Zhongguang XU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW STRESS REFRESH ERASE IN A MEMORY DEVICE
- Publication number 20240062827
- Publication date Feb 22, 2024
- Micron Technology, Inc.
- Ronit Roneel Prakash
- G11 - INFORMATION STORAGE
Information Patent Application
SOURCE BIAS TEMPERATURE COMPENSATION FOR READ AND PROGRAM VERIFY OP...
- Publication number 20230197175
- Publication date Jun 22, 2023
- Micron Technology, Inc.
- Ronit Roneel Prakash
- G11 - INFORMATION STORAGE
Information Patent Application
SEQUENTIAL WORDLINE ERASE VERIFY SCHEMES
- Publication number 20230117364
- Publication date Apr 20, 2023
- Micron Technology, Inc.
- Ronit Roneel Prakash
- G11 - INFORMATION STORAGE
Information Patent Application
SEQUENTIAL WORDLINE ERASE VERIFY SCHEMES
- Publication number 20220383963
- Publication date Dec 1, 2022
- Micron Technology, Inc.
- Ronit Roneel Prakash
- G11 - INFORMATION STORAGE

Ronit Roneel Prakash

Person

Patents Grantslast 30 patents

Sequential wordline erase verify schemes

Sequential wordline erase verify schemes

Patents Applicationslast 30 patents

INVERSE ERASE FOR MEMORY COMPONENTS

DYNAMIC ERASE VOLTAGE STEP

RELIABILITY GAIN IN MEMORY DEVICES WITH ADAPTIVELY SELECTED ERASE P...

OPTIMIZING DATA RELIABILITY USING ERASE RETENTION

LOW STRESS REFRESH ERASE IN A MEMORY DEVICE

SOURCE BIAS TEMPERATURE COMPENSATION FOR READ AND PROGRAM VERIFY OP...

SEQUENTIAL WORDLINE ERASE VERIFY SCHEMES

SEQUENTIAL WORDLINE ERASE VERIFY SCHEMES