Ronny Soetarman

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 11,536,940
- Issue date Dec 27, 2022
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 11,294,161
- Issue date Apr 5, 2022
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 10,884,228
- Issue date Jan 5, 2021
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Dual mode inspector
- Patent number 10,769,769
- Issue date Sep 8, 2020
- KLA-Tencor Corporation
- Steven W. Meeks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dual mode inspector
- Patent number 10,475,173
- Issue date Nov 12, 2019
- KLA-Tencor Corporation
- Steven W. Meeks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measurement of step size and plated metal thickness
- Patent number 10,359,613
- Issue date Jul 23, 2019
- KLA-Tencor Corporation
- James Jianguo Xu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus to detect defects in transparent solids
- Patent number 10,338,009
- Issue date Jul 2, 2019
- KLA-Tencor Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 10,209,501
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measurement of bump hieght
- Patent number 10,168,524
- Issue date Jan 1, 2019
- KLA-Tencor Corporation
- Ronny Soetarman
- G02 - OPTICS
Information Patent Grant
Optical measurement of opening dimensions in a wafer
- Patent number 10,157,457
- Issue date Dec 18, 2018
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Multi-surface specular reflection inspector
- Patent number 10,094,787
- Issue date Oct 9, 2018
- KLA-Tencor Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
3D microscope including insertable components to provide multiple i...
- Patent number 10,048,480
- Issue date Aug 14, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Grant
Method of detecting defect location using multi-surface specular re...
- Patent number 9,921,169
- Issue date Mar 20, 2018
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus to optically detect defects in transparent solids
- Patent number 9,784,691
- Issue date Oct 10, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
3D microscope and methods of measuring patterned substrates
- Patent number 9,389,408
- Issue date Jul 12, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G01 - MEASURING TESTING
Information Patent Grant
Multi-surface optical 3D microscope
- Patent number 9,036,869
- Issue date May 19, 2015
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G02 - OPTICS
Information Patent Grant
System and method for monitoring LED chip surface roughening process
- Patent number 8,976,366
- Issue date Mar 10, 2015
- Zeta Instruments, Inc.
- James Jianguo Xu
- G01 - MEASURING TESTING
Information Patent Grant
Surface finish roughness measurement
- Patent number 7,630,086
- Issue date Dec 8, 2009
- KLA-Tencor Corporation
- Dave S. Oak
- G01 - MEASURING TESTING
Information Patent Grant
Wafer edge inspection
- Patent number 7,532,318
- Issue date May 12, 2009
- KLA-Tencor Corporation
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Servo pattern characterization on magnetic disks
- Patent number 7,397,621
- Issue date Jul 8, 2008
- KLA-Tencor Technologies Corporation
- Zhen Hou
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer edge inspection
- Patent number 7,161,669
- Issue date Jan 9, 2007
- KLA-Tencor Technologies Corporation
- Vamsi Velidandla
- G01 - MEASURING TESTING
Information Patent Grant
System and method for automatically determining magnetic eccentrici...
- Patent number 7,075,741
- Issue date Jul 11, 2006
- KLA Tencor Technologues Corporation
- Ronny Soetarman
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for measuring thin film properties and analyzing...
- Patent number 6,268,919
- Issue date Jul 31, 2001
- Candela Instruments
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring thin film properties and analyzing...
- Patent number 6,229,610
- Issue date May 8, 2001
- Candela Instruments
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
High temperature thin film property measurement system and method
- Patent number 6,198,533
- Issue date Mar 6, 2001
- Candela Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring thin film properties and analyzing...
- Patent number 6,130,749
- Issue date Oct 10, 2000
- Candela Instruments
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
System and method for simultaneously measuring lubricant thickness...
- Patent number 6,031,615
- Issue date Feb 29, 2000
- Candela Instruments
- Steven W. Meeks
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
3D Microscope Including Insertable Components To Provide Multiple I...
- Publication number 20230087619
- Publication date Mar 23, 2023
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...
- Publication number 20210088768
- Publication date Mar 25, 2021
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...
- Publication number 20210080710
- Publication date Mar 18, 2021
- KLA-Tencor Corporation
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
AUTOMATED 3-D MEASUREMENT
- Publication number 20180045937
- Publication date Feb 15, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT OF STEP SIZE AND PLATED METAL THICKNESS
- Publication number 20180045946
- Publication date Feb 15, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT OF BUMP HIEGHT
- Publication number 20180045947
- Publication date Feb 15, 2018
- Zeta Instruments, Inc.
- Ronny Soetarman
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT OF OPENING DIMENSIONS IN A WAFER
- Publication number 20180047148
- Publication date Feb 15, 2018
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
DUAL MODE INSPECTOR
- Publication number 20180005364
- Publication date Jan 4, 2018
- Zeta Instruments, Inc.
- Steven W. Meeks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF DETECTING DEFECT LOCATION USING MULTI-SURFACE SPECULAR RE...
- Publication number 20170336330
- Publication date Nov 23, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SURFACE SPECULAR REFLECTION INSPECTOR
- Publication number 20170336331
- Publication date Nov 23, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS
- Publication number 20170261440
- Publication date Sep 14, 2017
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160253813
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20160252714
- Publication date Sep 1, 2016
- Zeta Instruments, Inc.
- Zhen Hou
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS
- Publication number 20160033421
- Publication date Feb 4, 2016
- Zeta Instruments, Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
System And Method For Monitoring LED Chip Surface Roughening Process
- Publication number 20120327414
- Publication date Dec 27, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
3D Microscope Including Insertable Components To Provide Multiple I...
- Publication number 20120176475
- Publication date Jul 12, 2012
- Zeta Instruments, Inc.
- James Jianguo Xu
- G02 - OPTICS
Information Patent Application
Multi-Surface Optical 3D Microscope
- Publication number 20120051660
- Publication date Mar 1, 2012
- Zeta Instruments, Inc.
- Ken Kinsun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D Microscope And Methods Of Measuring Patterned Substrates
- Publication number 20120019626
- Publication date Jan 26, 2012
- Zeta Instruments, Inc.
- Zhen Hou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER EDGE INSPECTION
- Publication number 20070127016
- Publication date Jun 7, 2007
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
SURFACE FINISH ROUGHNESS MEASUREMENT
- Publication number 20070115483
- Publication date May 24, 2007
- Dave S. Oak
- G01 - MEASURING TESTING
Information Patent Application
Wafer edge inspection
- Publication number 20060250611
- Publication date Nov 9, 2006
- KLA-Tencor Technologies Corp.
- Vamsi Velidandla
- G01 - MEASURING TESTING
Information Patent Application
Servo pattern characterization on magnetic disks
- Publication number 20060215289
- Publication date Sep 28, 2006
- KLA-Tencor Technologies Corp.
- Zhen Hou
- G11 - INFORMATION STORAGE

Ronny Soetarman

Person

Patents Grantslast 30 patents

3D microscope including insertable components to provide multiple i...

3D microscope including insertable components to provide multiple i...

3D microscope including insertable components to provide multiple i...

Dual mode inspector

Dual mode inspector

Optical measurement of step size and plated metal thickness

Method and apparatus to detect defects in transparent solids

3D microscope and methods of measuring patterned substrates

Optical measurement of bump hieght

Optical measurement of opening dimensions in a wafer

Multi-surface specular reflection inspector

3D microscope including insertable components to provide multiple i...

Method of detecting defect location using multi-surface specular re...

Method and apparatus to optically detect defects in transparent solids

3D microscope and methods of measuring patterned substrates

Multi-surface optical 3D microscope

System and method for monitoring LED chip surface roughening process

Surface finish roughness measurement

Wafer edge inspection

Servo pattern characterization on magnetic disks

Wafer edge inspection

System and method for automatically determining magnetic eccentrici...

System and method for measuring thin film properties and analyzing...

System and method for measuring thin film properties and analyzing...

High temperature thin film property measurement system and method

System and method for measuring thin film properties and analyzing...

System and method for simultaneously measuring lubricant thickness...

Patents Applicationslast 30 patents

3D Microscope Including Insertable Components To Provide Multiple I...

3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...

3D MICROSCOPE INCLUDING INSERTABLE COMPONENTS TO PROVIDE MULTIPLE I...

AUTOMATED 3-D MEASUREMENT

OPTICAL MEASUREMENT OF STEP SIZE AND PLATED METAL THICKNESS

OPTICAL MEASUREMENT OF BUMP HIEGHT

OPTICAL MEASUREMENT OF OPENING DIMENSIONS IN A WAFER

DUAL MODE INSPECTOR

METHOD OF DETECTING DEFECT LOCATION USING MULTI-SURFACE SPECULAR RE...

MULTI-SURFACE SPECULAR REFLECTION INSPECTOR

METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS

3D Microscope And Methods Of Measuring Patterned Substrates

3D Microscope And Methods Of Measuring Patterned Substrates

METHOD AND APPARATUS TO DETECT DEFECTS IN TRANSPARENT SOLIDS

System And Method For Monitoring LED Chip Surface Roughening Process

3D Microscope Including Insertable Components To Provide Multiple I...

Multi-Surface Optical 3D Microscope

3D Microscope And Methods Of Measuring Patterned Substrates

WAFER EDGE INSPECTION

SURFACE FINISH ROUGHNESS MEASUREMENT

Wafer edge inspection

Servo pattern characterization on magnetic disks