Roy E. Swart

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Beamforming device testing
- Patent number 12,113,583
- Issue date Oct 8, 2024
- FormFactor, Inc.
- Dennis Rosenauer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Manufacturing advanced test probes
- Patent number 10,627,427
- Issue date Apr 21, 2020
- Intel Corporation
- Roy E. Swart
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe head assemblies and probe systems for testing integrated circ...
- Patent number 10,120,020
- Issue date Nov 6, 2018
- FormFactor Beaverton, Inc.
- Jay Salmon
- G01 - MEASURING TESTING
Information Patent Grant
Liquid metal interconnects
- Patent number 9,835,648
- Issue date Dec 5, 2017
- Intel Corporation
- Rajashree Baskaran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interposer to regulate current for wafer test tooling
- Patent number 9,391,447
- Issue date Jul 12, 2016
- Intel Corporation
- Evan M. Fledell
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Increasing current carrying capability through direct liquid coolin...
- Patent number 9,360,502
- Issue date Jun 7, 2016
- Intel Corporation
- Warren S. Crippen
- G01 - MEASURING TESTING
Information Patent Grant
Test probe structures and methods including positioning test probe...
- Patent number 9,279,830
- Issue date Mar 8, 2016
- Intel Corporation
- Roy E. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Probes formed from semiconductor region vias
- Patent number 8,513,966
- Issue date Aug 20, 2013
- Intel Corporation
- Qing Ma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Beamforming Device Testing
- Publication number 20210211210
- Publication date Jul 8, 2021
- Dennis Rosenauer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electrical test probes having decoupled electrical and mechanical d...
- Publication number 20190383857
- Publication date Dec 19, 2019
- January Kister
- G01 - MEASURING TESTING
Information Patent Application
MANUFACTURING ADVANCED TEST PROBES
- Publication number 20180045760
- Publication date Feb 15, 2018
- Intel Corporation
- Roy E. SWART
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE HEAD ASSEMBLIES AND PROBE SYSTEMS FOR TESTING INTEGRATED CIRC...
- Publication number 20170363681
- Publication date Dec 21, 2017
- Cascade Microtech, Inc.
- JAY SALMON
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMERS, PLANARIZATION LAYERS FOR SPACE TRANSFORMERS, ME...
- Publication number 20170330677
- Publication date Nov 16, 2017
- Cascade Microtech, Inc.
- Jay Salmon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING ADVANCED TEST PROBES
- Publication number 20150008950
- Publication date Jan 8, 2015
- Roy E. Swart
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEST PROBES
- Publication number 20140239995
- Publication date Aug 28, 2014
- Roy E. Swart
- G01 - MEASURING TESTING
Information Patent Application
INCREASING CURRENT CARRYING CAPABILITY THROUGH DIRECT LIQUID COOLIN...
- Publication number 20140210499
- Publication date Jul 31, 2014
- Warren S. Crippen
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER TO REGULATE CURRENT FOR WAFER TEST TOOLING
- Publication number 20140029150
- Publication date Jan 30, 2014
- Evan M. Fledell
- G01 - MEASURING TESTING
Information Patent Application
LIQUID METAL INTERCONNECTS
- Publication number 20130000117
- Publication date Jan 3, 2013
- Rajashree Baskaran
- G01 - MEASURING TESTING
Information Patent Application
PROBES FORMED FROM SEMICONDUCTOR REGION VIAS
- Publication number 20120038379
- Publication date Feb 16, 2012
- Qing Ma
- G01 - MEASURING TESTING

Roy E. Swart

Person

Patents Grantslast 30 patents

Beamforming device testing

Manufacturing advanced test probes

Probe head assemblies and probe systems for testing integrated circ...

Liquid metal interconnects

Interposer to regulate current for wafer test tooling

Increasing current carrying capability through direct liquid coolin...

Test probe structures and methods including positioning test probe...

Probes formed from semiconductor region vias

Patents Applicationslast 30 patents

Beamforming Device Testing

Electrical test probes having decoupled electrical and mechanical d...

MANUFACTURING ADVANCED TEST PROBES

PROBE HEAD ASSEMBLIES AND PROBE SYSTEMS FOR TESTING INTEGRATED CIRC...

SPACE TRANSFORMERS, PLANARIZATION LAYERS FOR SPACE TRANSFORMERS, ME...

MANUFACTURING ADVANCED TEST PROBES

TEST PROBES

INCREASING CURRENT CARRYING CAPABILITY THROUGH DIRECT LIQUID COOLIN...

INTERPOSER TO REGULATE CURRENT FOR WAFER TEST TOOLING

LIQUID METAL INTERCONNECTS

PROBES FORMED FROM SEMICONDUCTOR REGION VIAS