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Roy Ramon VEENSTRA
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Delft, NL
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last 30 patents
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Patent Application
CHARGED PARTICLE APPARATUS AND METHOD
Publication number
20240128043
Publication date
Apr 18, 2024
ASML NETHERLANDS B.V.
Jurgen VAN SOEST
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD AND IMAGE
Publication number
20230304949
Publication date
Sep 28, 2023
ASML NETHERLANDS B.V.
Roy Ramon VEENSTRA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION METHOD AND INSPECTION TOOL
Publication number
20230298850
Publication date
Sep 21, 2023
ASML NETHERLANDS B.V.
Marijke SCOTUZZI
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
A DETECTOR SUBSTRATE FOR USE IN A CHARGED PARTICLE MULTI-BEAM ASSES...
Publication number
20230238211
Publication date
Jul 27, 2023
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
H01 - BASIC ELECTRIC ELEMENTS