Membership
Tour
Register
Log in
Ruben Alvarez Sanchez
Follow
Person
Veldhoven, NL
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method to predict yield of a device manufacturing process
Patent number
11,714,357
Issue date
Aug 1, 2023
ASML Netherlands B.V.
Alexander Ypma
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method to predict yield of a device manufacturing process
Patent number
11,086,229
Issue date
Aug 10, 2021
ASML Netherlands B.V.
Alexander Ypma
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for measuring a structure on a substrate, comp...
Patent number
9,977,340
Issue date
May 22, 2018
ASML Netherlands B.V.
Maria Johanna Hendrika Aben
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Inspection method and apparatus
Patent number
9,360,768
Issue date
Jun 7, 2016
ASML Netherlands B.V.
Gerardo Bottiglieri
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method and apparatus, lithographic apparatus, lithograph...
Patent number
8,848,195
Issue date
Sep 30, 2014
ASML Netherlands B.V.
Christian Marinus Leewis
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS
Publication number
20210325788
Publication date
Oct 21, 2021
ASML NETHERLANDS B.V.
Alexander YPMA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS
Publication number
20200103761
Publication date
Apr 2, 2020
ASML NETHERLANDS B.V.
Alexander YPMA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Inspection Method and Apparatus
Publication number
20120330592
Publication date
Dec 27, 2012
ASML NETHERLANDS B.V.
Gerardo Bottiglieri
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Measuring a Structure on a Substrate, Comp...
Publication number
20120123748
Publication date
May 17, 2012
ASML NETHERLANDS B.V.
Maria Johanna Hendrika Aben
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...
Publication number
20120033223
Publication date
Feb 9, 2012
ASML NETHERLANDS B.V.
Christian Marinus Leewis
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY