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Ruben Cornelis Maas
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Utrecht, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Particle beam apparatus, defect repair method, lithographic exposur...
Patent number
11,996,267
Issue date
May 28, 2024
ASML Netherlands B.V.
Ruben Cornelis Maas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of metrology and associated apparatuses
Patent number
11,733,614
Issue date
Aug 22, 2023
ASML Netherlands B.V.
Thomas Jarik Huisman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of metrology and associated apparatuses
Patent number
11,112,703
Issue date
Sep 7, 2021
ASML Netherlands B.V.
Thomas Jarik Huisman
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR DETERMINING DEFECTIVENESS OF PATTERN BASED ON AFTER DEVE...
Publication number
20220342316
Publication date
Oct 27, 2022
ASML NETHERLANDS B.V.
Marleen KOOIMAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF METROLOGY AND ASSOCIATED APPARATUSES
Publication number
20220107571
Publication date
Apr 7, 2022
ASML NETHERLANDS B.V.
Thomas Jarik Huisman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PARTICLE BEAM APPARATUS, DEFECT REPAIR METHOD, LITHOGRAPHIC EXPOSUR...
Publication number
20210327678
Publication date
Oct 21, 2021
ASML NETHERLANDS B.V.
Ruben Cornelis MAAS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF METROLOGY AND ASSOCIATED APPARATUSES
Publication number
20190294055
Publication date
Sep 26, 2019
ASML Netherlands B.V.
Thomas Jarik Huisman
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY