Ruediger Bormann

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Rosengarten, DE

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analysis apparatus with a graded multilayer mirror
- Patent number 6,226,349
- Issue date May 1, 2001
- Bruker AXS Analytical X-ray Systems GmbH
- Manfred Schuster
- G01 - MEASURING TESTING