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Ruediger Solbach
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Hamburg, DE
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Patents Grants
last 30 patents
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Patent Grant
IC testing methods and apparatus
Patent number
8,327,205
Issue date
Dec 4, 2012
NXP B.V.
Tom Waayers
G01 - MEASURING TESTING
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Patent Grant
Arrangement and method of testing an integrated circuit
Patent number
6,789,219
Issue date
Sep 7, 2004
Koninklijke Philips Electronics N.V.
Friedrich Hapke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Ic Testing Methods and Apparatus
Publication number
20090003424
Publication date
Jan 1, 2009
NXP B.V.
Tom Waayers
G01 - MEASURING TESTING
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Patent Application
Arrangement and method of testing an integrated circuit
Publication number
20020069385
Publication date
Jun 6, 2002
Friedrich Hapke
G01 - MEASURING TESTING